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ID:44110979
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页数:4页
时间:2019-10-18
《SEMI P20-92N GUIDELINE FOR CATALOG PUBLICATION OF EB RESIST》由会员上传分享,免费在线阅读,更多相关内容在行业资料-天天文库。
1、SEMIP20-92N/A©SEMI1992,1996GUIDELINEFORCATALOGPUBLICATIONOFEBRESISTPARAMETERS(PROPOSAL)1Purposeratus.Specifyheatingrateandcoolingrateifmoni-tored.ThepurposeofthisguidelineistoprovideabaselineforpublicationsofEBresistparameters.Itcanalsobe4.2.5ThicknessM
2、easurementMethodsÑThicknessusedasaguidetoevaluateresistprocessparameters.measurementinstrumentsandmeasurementmethod.InThisguidelineisintendedtobeapplicableforelectroncaseofalightinterferancethicknessmeasurementbeamprocesses.apparatus,specifytherefractiv
3、eindexasaparameterusedinthemeasurement.TheparametersforEBResistpublicationarediscussedbelow.5FilmThicknesses2ResistCommercialNameDeÞnesresistthicknessesandmeasurementconditionsforresistparameterdescriptionsinandafterSection9.Describeresistcommercialname
4、.Unitismmor.3ResistProperties5.1FilmThicknessDeÞnitions3.1PolymerProperties5.1.1TiÑInitialthicknessafterprebakepriortoexposure.3.1.1ComponentsÑDescriberesistcomponents.Chemicalstructureisnotnecessarilyrequired.5.1.2TeÑExposedregionthicknessafterdevelop-
5、ment.3.1.2MolecularWeightÑDescribeMw,MnandMw/Mnifknown.5.1.3TuÑUnexposedregionthicknessafterdevel-opment,andafterpostbakeifrequired.3.1.3ThermalCharacteristicsÑDescribeTgandTm.5.1.4NTeÑTe/Ti.Normalizedexposedregionthick-ness.3.2ResistSolutionProperties5
6、.1.5NTuÑTu/Ti.Normalizedunexposedregion3.2.1SolventÑSpecifychemicalnames.thickness.3.2.2ViscosityÑSolutionviscosity,cP,25¡C.5.2ThicknessMeasurementConditionsÑThickness3.2.3SolidContentÑWeight%.measurementconditionsshouldbethesameasdescribedinSection4.2.
7、5.Incaseofmeasurementsof4FilmFormingPropertiesexposedregionthickness,exposedregionareashould4.1ThicknessCurvesÑPlotfilmthicknessT(mmorbelargerthan20mmonallsides.)afterprebakeversusspinningspeedR(rpm).Here,xaxisislog(R)andyaxisislog(T).6SamplePreparation
8、4.2ConditionsÑSpecifyfollowingconditions.DeÞnessamplepreparationmethodsforresistparame-terdescriptionsinandafterSection9.4.2.1SubstrateÑSiliconwaferorchromemaskblank.Specifyitsstructure.6.1FilmThicknessÑTi.0.50±0.20mm(5000±200)is
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