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ID:40352201
大小:4.76 MB
页数:73页
时间:2019-07-31
《Crystallization and Thermoelectric Transport in Semiconductor Micro- and Nanostructures Under Extreme Conditions》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、DE-SC00050389/1/10-5/31/17FINALTECHNICALREPORTCRYSTALLIZATIONANDTHERMOELECTRICTRANSPORTINSEMICONDUCTORMICRO-ANDNANOSTRUCTURESUNDEREXTREMECONDITIONSSubmittedAugust30,2017AliGokirmakHelenaSilvaUniversityofConnecticut1.ABSTRACT..........................................................
2、...................................................................................32.AWARDPERIOD9/1/2010TO3/1/2013..................................................................................................4Summaryofobjectivesandaccomplishments...............................
3、...........................................................4High-temperaturethermoelectrictransportatsmallscales.......................................................................4Finiteelementsimulations&materialsparameters......................................................
4、............................7Extractionoftemperaturedependentelectricalresistivityandthermalconductivityunderextremethermalgradients.....................................................................................................................................12Percolationtran
5、sportandfilamentformationinnanocrystallinesiliconnanowires...............................14Crystallizationofsiliconmicrostructuresthroughrapidself-heating.....................................................17Significanceofthermoelectriceffectsonself-heatingcrystallizationdepending
6、onelectricalconditions-relativeimpactofJouleandThomsonheat..........................................................................................20Relatedpublications(9/2010to3/2013).................................................................................................
7、213.NON-EQUILIBRIUMSEMICONDUCTORFINITEELEMENTMODELING–GENERATION-TRANSPORT-RECOMBINATIONOFMINORITYCARRIERS.................................................................................................23Bandgapdegradation...........................................................
8、..........................
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