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ID:44110750
大小:46.61 KB
页数:10页
时间:2019-10-18
《SEMI E69-0298 TEST METHOD FOR DETERMINING REPRSEMI E70-0698》由会员上传分享,免费在线阅读,更多相关内容在行业资料-天天文库。
1、4SEMIE70-0698N/A©SEMI1998GUIDEFORTOOLACCOMMODATIONPROCESSNOTE:Thisentiredocumentwasrevisedin1998.1PurposeSEMIE49.3ÑGuideforUltrahighPurityDeionizedWaterandChemicalDistributionSystemsinSemicon-1.1ThisdocumentwillprovideanoverviewoftheductorManufacturingEquipment
2、variouselementsofToolAccommodation,amethodol-ogybywhichsemiconductorprocessingequipmentisSEMIE49.4ÑGuideforHighPuritySolventDistri-installedinacost-effectiveandtimelymanner.ThisbutionSystemsinSemiconductorManufacturingadditiontotheSEMIToolAccommodationStandards
3、EquipmentsetdescribestheprocessbywhichthereferencedSEMIE49.5ÑGuideforUltrahighPuritySolventSEMIdocumentscanbeeffectivelyusedtoachieveDistributionSystemsinSemiconductorManufacturingtoolinstallationcostandschedulegoals.Equipment2ScopeSEMIE49.6ÑGuideforSubsystemAs
4、semblyandTestingProcedures-StainlessSteelSystems2.1Thisoverviewdocumentwillprovideprocessdevelopment,facilities,manufacturing,andsalesengi-SEMIE49.7ÑGuideforSubsystemAssemblyandneers(aswellaspurchasingagentsandmanagers)withTestingProcedures-PolymerSystemsabasic
5、understandingofthevariouselementsinaToolSEMIE49.8ÑGuideforHighPurityGasDistributionAccommodationmethodology.Thisprocessempha-SystemsinSemiconductorManufacturingEquipmentsizesquality,completeness,timeliness,andcost-effec-tivenessaskeyelementsofsuccessfullyinstal
6、lingSEMIE49.9ÑGuideforUltrahighPurityGasDistri-semiconductorprocessingequipmentintowaferfabri-butionSystemsinSemiconductorManufacturingcationfacilities.Bydescribingagenericprocessßow,EquipmentthisdocumentidentiÞesaroadmapforusingpub-SEMIE51ÑGuideforTypicalFacil
7、itiesServicesandlishedstandardsthatcomprehendalltheproceduresTerminationMatrixinvolvedintoolaccommodationfromprocurement3.2OtherDocument1throughacceptance.Asacommongroundforcommu-nicationandcomparison,termsanddeÞnitionsarealsoFederalStandard209EÑAirborneParticu
8、lateClean-included.linessClassesinCleanroomsandCleanZones3ReferencedDocuments4SummaryofReferencedDocumentsNOTE:Alldocumentscitedwillbethelatestpublished4.1SEMIE6ÑFacilitiesI
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