BS IEC 62047-32-2019 Semiconductor devices — Micro-electromechanical devices Part 32_ Test method for the nonlinear vibration of MEMS resonators
BS IEC 62047-32-2019 Semiconductor devices — Micro-electromechanical devices Part 32_ Test method for the nonlinear vibration of MEMS resonators
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大小:653.96 KB
页数:21页
时间:2019-04-15
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