IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods – Part 28 Electrostatic discharge （ESD） sensitivity testing – Charged device model （CDM） – device level

《IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods – Part 28 Electrostatic discharge （ESD） sensitivity testing – Charged device model （CDM） – device level》由会员上传分享，免费在线阅读，更多相关内容在行业资料-天天文库。

1、IEC60749-28®Edition1.02017-03INTERNATIONALSTANDARDcolourinsideSemiconductordevices–Mechanicalandclimatictestmethods–Part28:Electrostaticdischarge(ESD)sensitivitytesting–Chargeddevicemodel(CDM)–devicelevel)n(e7-031208:9-27460CEITHISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright©2017IEC,

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