Understanding the Value of Signal Integrity Testing

Understanding the Value of Signal Integrity Testing

ID:39755439

大小:1.52 MB

页数:14页

时间:2019-07-10

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1、TN-00-20:UnderstandingtheValueofSITestingIntroductionTechnicalNoteUnderstandingtheValueofSignalIntegrityTestingIntroductionHistorically,designengineershaveusedsignalintegrity(SI)testingasakeypartofthedesignanddevelopmentofnewsystemsandforsustainingqualifications.

2、WhileSItestingisextremelyvaluableintheengineeringprototypephase,itisnotalwaystherighttool.Infact,itsvaluediminishesastheproductdesignprogresses.Afterdebugofearlyprototypesiscomplete,powerfultoolsthatperformtemperatureandvoltagemargintestingshouldsupplementorrepla

3、ceSItesting,especiallyforthequalificationofmemorydieshrinksandalternatesourcing.Theproperselectionofmemorydesign,test,andverificationtoolsreducesengineeringtimeandincreasestheprobabilityofdetectingpotentialproblems.Thistechnicalnotedescribeshowthesetoolscanbeused

4、tothebestadvantage,fromconceptionofanewproductthroughendoflife.ItalsoprovidesadetaileddescriptionofSI,itsuses,andlimitations.Finally,itpresentsanoverviewofmargintestingtoolsandthevaluetheycanadd.ToolsforMemoryDesign,Testing,andVerificationFiveessentialtoolsusedfo

5、rmemorydesignarelistedinTable1.However,thisisnotacompletelistbecauseitsfocusisonlyontoolsthatcanbeusedtovalidatethefunction-alityandrobustnessofadesign.Whenusedproperly,thesetoolsleadtoreduceddesigntimeandmorerobustsystems.Table1:MemoryDesign,Testing,andVerificat

6、ionToolsTools1ExamplesElectricalSimulationsSPICEorIBISBehavioralSimulationsVerilogorVHDLSignalIntegrityOscilloscopeandprobes;possiblymixedmodetoallowformoreaccuratesignalcaptureMarginTestingGuardbandtestingand4-cornertestingbyvariationofvoltageandtemperatureCompa

7、tibilityTestingFunctionalsoftwaretestingorsystemreboottestNotes:1.Thelogicanalyzerisnotincludedinthislist,althoughmostdebuglabsincludethistoolasanintegralpartoftheirdesignanddebugprocess.However,duetothecostandtimeinvolved,itisrarelythefirsttoolusedtodetectasyste

8、mfailureorproblem.Rather,itisusedtodebugaproblemdetectedbycompatibility,4-corner,orothertesting.PDF:09005aef8172701b/Source:09005aef81726ffcMicronTechnology,In

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