Electronic activity of SiC precipitates in multicrystalline solar silicon

Electronic activity of SiC precipitates in multicrystalline solar silicon

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时间:2019-07-09

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1、phys.stat.sol.(a)204,No.7,2190–2195(2007)/DOI10.1002/pssa.200675436ElectronicactivityofSiCprecipitatesinmulticrystallinesolarsilicon*,112JanBauer,OtwinBreitenstein,andJean-PatriceRakotoniaina1MaxPlanckInstituteofMicrostructurePhysics,Weinberg2,06120Halle,Germany2Q-CellsAG,Guardianstraße16,06766Th

2、alheim,GermanyReceived17September2006,revised23April2007,accepted24April2007Publishedonline3July2007PACS72.80.Jc,73.40.Lq,84.60.JtIntheupperpartofblock-castmulticrystallinesilicononeoftenfindssiliconcarbideandsiliconnitrideprecipitatesandinclusions.Thesecontaminantscancausesevereohmicshuntsinsola

3、rcellsandthusde-creasetheefficiencyofthesolarcellsverystrongly.Itiswellknownthatthesiliconcarbideprecipitatescausetheohmicshunts.However,theelectricalpropertiesofthesiliconcarbidewasunknownsofar.Tostudytheelectricalpropertiesofthesesiliconcarbideparticlesweisolatedthemfromthesiliconbulkma-teriala

4、ndperformeddifferentelectricalmeasurementsonthem.Themeasurementsshowthatthesiliconcarbideprecipitatesarehighlyconductive.Aninvestigationoftheheterojunctionsilicon–siliconcarbidewasalsoperformedandasimulationofthisheterojunctionleadstoanewmodeloftheohmicshuntmechanism.Itisconcludedthattheshuntcurr

5、entflowsinsideofthefilaments.©2007WILEY-VCHVerlagGmbH&Co.KGaA,Weinheim1IntroductionTheefficiencyofmulticrystallinesiliconsolarcellscanbestronglyreducedbymaterial-inducedshunts[1].Theseshuntsarecausedbysiliconcarbide(SiC)precipitates[2],whichweregeneratedduringthecrystallisationofthemulticrystalli

6、nesilicon(mc-Si)ingotattheblock-castingprocess[3].Itiswellknownthatso-calledSiC-filamentscausedangerousohmicshuntsinsolarcells[2].However,theelec-tricalpropertiesandtheelectronicactivityoftheSiCparticles,whichareembeddedinthemc-Si,wereunknownsofar.SincetheSiC-filamentscanhavealengthuptosomemillim

7、eters,theycandamageseveralsolarcellwafers,anditwillbeimportanttoknowmoreabouttheshuntingmechanism.ThispaperconcentratesontheelectricalmeasurementsoftheSiC-filamentsandtheelectronicactivityoftheseprecipitatesinthemc-Sib

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