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ID:33663082
大小:8.10 MB
页数:66页
时间:2019-02-28
《聚酰亚胺介孔分子筛低介电常数复合薄膜的制备及性能研究》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、北京化工大学硕士研究生毕业论文聚酰亚胺/介孔分子筛低介电常数复合薄膜的制备及性能研究摘要随着超大规模集成电路(ULSI)器件集成度的提高,亟需开发新型低介电常数(10w.k)材料来降低由于特征尺寸的降低所带来的信号容阻(RC)延迟、串扰以及能耗等问题。聚合物基复合薄膜在微电子行业具有广阔的应用前景,氧化硅介孔分子筛MCM.4l具有超低介电常数,使其成为比较合适的低介电复合材料的填料。本文主要研究了聚酰亚胺/介孔分子筛(P蹦CM41)复合薄膜的制备方法及其性能。采用溶胶.凝胶法制备了MCM41分子筛,分别通过原位分散聚合工艺和球磨分散工艺将具有超低介电常数的MCM.4l粒子复合到PI
2、基体中以制备低介电常数PⅢCM.41复合薄膜。采用TEM、SEM、U讥Ⅵs、TGA、阻抗分析仪等对复合薄膜的微观结构、热性能、电性能等进行了研究。结果显示:无机粒子在P瑚CM.4l复合薄膜中分散均匀,介电常数降至2.58,体积电阻率和击穿场强均得到提高,分别达到3.139×1016Q皿和255.45MVm~。球磨工艺得到的复合薄膜性能要优于原位分散聚合得到的复合薄膜性能。这样的低介电复合材料有望在集成电路中得到应用。关键词:聚酰亚胺,MCM-41,低介电常数,击穿强度,电阻率北京化工大学硕士研究生毕业论文PREPARATIoNANDPRoPERTIESoFPoLyIMIDE/MES
3、oPoRoUSSILICASIEVECoMPoSITEFILMSWITHLoWDIELECTIUCCoNSTANTABSTRACTLowdielectricconstantmaterialswereexploredinordertoreducetheresistancecapacitancetime(RC)delay,cross—tall(sandpowerconsumptioncausedbytheincreasingdeVicedensitiesinultra-1a唱e—scaleintegrated(ULSI)cirCuits.P01ymer-baseddielectricc
4、oII]lposite矗1msheVebeenproVedt0bepromisingforuseinmeInicroelectronicsindus略TheMCM一41withmeultralowdielectdcconstantwaSmixedintOp01yIllerstoobtainthe10w-kcompositefilms.Inthiswork,pr印arationandpropeniesofp01),imide/mesoporoussieve(PI/MCM一41)compositcfilmswerestudied.ThemesoporoussieveMCM-41wass
5、yIlthesizedbyⅡlesol·gelmethod,andlow-kPUMCM一4lcompositefilmswithdi蜀f.erentloadingofMCM一4lpanicleswerepr印aredusingthemethodsofin—situpolylnerizationand北京化工大学硕士研究生毕业论文ball—milling,respectiVely.TEM,SEM,themalconstantsanalyzer'impedanceanalyzerwereusedtocharacterizethemicrostructuresandmeasurethem
6、e咖alanddielectricpropeniesoftheachievedPI/MCM一41Compositefilms.TheresultsshowedthatMCM4lpaniclesweredispersedweninPImatrixandthedielectricconstantofP聊订CM-41conlpositefilmswasdecreasedto2.58.Meanwhile,t11ev01umeresistivityandbreakdownstrengmwereincreasedto3.139×1016Q.mand255.45MVm~,respectively
7、ItwasobviousthatthedielectricpropertiesofP们MCM一4lcompositefilmsbyball·millingarebetterthanthosepreparedbyin-situdispersionpolyIllerization.Therefore,thiskindofPI/,MCM一41coInpositefilmshaspotentialandbroadapplicationsinmicroelectronicind
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