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1、NationalAeronauticsandSpaceAdministrationMicroelectronicsReliability:Physics-of-FailureBasedModelingandLifetimeEvaluationMarkWhiteJetPropulsionLaboratoryPasadena,CaliforniaJosephB.BernsteinUniversityofMarylandCollegePark,MarylandJetPropulsionLaboratoryCaliforniaInstituteofTechnologyPasadena,Califo
2、rniaJPLPublication08-52/08NationalAeronauticsandSpaceAdministrationMicroelectronicsReliability:Physics-of-FailureBasedModelingandLifetimeEvaluationNASAElectronicPartsandPackaging(NEPP)ProgramOfficeofSafetyandMissionAssuranceMarkWhiteJetPropulsionLaboratoryPasadena,CaliforniaJosephB.BernsteinUniver
3、sityofMarylandCollegePark,MarylandNASAWBS:939904.01.11.10JPLProjectNumber:102197TaskNumber:1.18.5JetPropulsionLaboratory4800OakGroveDrivePasadena,CA91109http://nepp.nasa.govThisresearchwasprimarilycarriedoutattheUniversityofMarylandunderthedirectionofProfessorJosephB.Bernsteinandwassponsoredinpart
4、bytheNationalAeronauticsandSpaceAdministrationElectronicPartsandPackaging(NEPP)Program,theAerospaceVehicleSystemsInstitute(AVSI)Consortium—specifically,AVSIProject#17:MethodstoAccountforAcceleratedSemiconductorWearout—andtheOfficeofNavalResearch.Referencehereintoanyspecificcommercialproduct,proces
5、s,orservicebytradename,trademark,manufacturer,orotherwise,doesnotconstituteorimplyitsendorsementbytheUnitedStatesGovernmentortheJetPropulsionLaboratory,CaliforniaInstituteofTechnology.Copyright2008.Allrightsreserved.iiPREFACEThesolid-stateelectronicsindustryfacesrelentlesspressuretoimproveperforma
6、nce,increasefunctionality,decreasecosts,andreducedesignanddevelopmenttime.Asaresult,devicefeaturesizesarenowinthenanometerscalerangeanddesignlifecycleshavedecreasedtofewerthanfiveyears.Untilrecently,semiconductordevicelifetimescouldbemeasuredindecades,whichwasessentiallyinfinitewithrespecttotheirr
7、equiredservicelives.Itwas,therefore,notcriticaltoquantifythedevicelifetimesexactly,oreventounderstandthemcompletely.Foravionics,medical,military,andeventelecommunicationsapplications,itwasreasonabletoassumethatal
