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ID:39204799
大小:1.46 MB
页数:40页
时间:2019-06-27
《Etching Process 英文文献资料》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、EtchingProcess1ContentsßEtchingIntroductionßDryEtchingProcessßWetEtchingProcessßCleaningProcessIntroductionßSummary2ßEtchingIntroduction(4)曝光、顯影(1)基板表面平坦化薄膜區(5)蝕刻(DryorWet)(2)鍍膜黃光區(3)上光阻(6)去光阻(Wet)蝕刻區3EtchProfile4DryEtchvs.WetEtch¢ComparisonofEquipmentComparisonofDryEtchWet
2、etchEquipmentInitialCostHighLowFootPrintSmallLargeRunningCostLowHighThroughputLowHighUp-TimeHighHigh5DryEtchvs.WetEtch¢ComparisonofProcessComparisonofProcessDryEtchWetetchEtchRateLowHighUniformityGoodPoorRepeatabilityGoodPoorCDLossSmallLargeSelectivitytoUnderLayerPoorGoodPr
3、ofileControlGoodVeryPoorMultiLayerEtchPossibleDifficult6EtchingMechanism(1)7EtchingMechanism(2)8ContentsßEtchingIntroductionßDryEtchingProcessDryEtchingProcessßWetEtchingProcessßCleaningProcessIntroductionßSummary9DryEtch–WhatisPlasma?¢Plasma-•◆Aplasmaisa“quasi-neutral”gaso
4、fchargedandneutralparticleswhichexhibits“collectivebehavior”.-◆指一個遭受部分離子化的氣體;氣體的組成,有各種帶電荷的電子、離子(Ion),及不帶電的分子和原子團(Radicals)等,其總帶電量為零。10DryEtch–WhatisPlasmaetch?•◆產生Plasma三要素:RFPower/ElectrodeSpace/LowPressure11NonmetallicEtchingFilmEtchantSelectivityα-SiSF/O62CF4/O2Cl2/O250:
5、1HBr/O2100:1SiNxSF6/O2goodCF4/O2NF3/O2CHF3/CH2F2/O2TEOS&SiOxCF4/O2CHF3/O2C4F812MetallicEtchingFilmEtchantAl&TiBCl3/Cl2BCl3enhancetheetchabilityofmetaloxideininitiateetchingCrCl2/O2ResidualCl2exposureinatmospherichumiditytoformHCl,whichcorrodethemetal.MoW&MoSF6/CF4/O2Cl2/O2I
6、TOCH4/H2Cl2HIHBr13SiOxmechanism14WhataretheconcernsforDryetching?¢Uniformity&Etchingrate¢Taperprofilecontrol¢CDlosscontrol¢Selectivity¢Plasmadamage¢PRremoval¢Residue¢EPDcontrol15TaperProfileControl16TaperProfileControl17TaperProfileControl18TaperProfileControl¢Stepcoverage1
7、9TaperProfileControl¢Taperingfeaturebyresisterosion20CDLossControl¢CriticalDimensionLoss◆黃光製程完成後原本是10um的線,經過蝕刻製程後量測,線寬變為9um,則CDLoss為1um。◆線寬越來越小時,CDLossControl則更為重要。◆Taper會影響線寬。◆當線寬變小時,Taper較不重要,CDLoss則較為重要。21Selectivity22PlasmaDamage¢PRafterImplantation23PRRemoval¢PRRemoval
8、Issue◆Iondopping製程完成後,光阻會有無法去除的問題,尤其是在高劑量及長時間的製程後。◆乾蝕刻製程如果蝕刻時間過久,也會有光阻去除的問題。◆濕蝕刻時,
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