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1、MIL-STD-202GMETHOD310CONTACT-CHATTERMONITORING接點抖動監測1.PURPOSE.Thistestisconductedforthepurposeofdetectingcontact-chatterinelectricalandelectroniccomponentpartshavingmovableelectricalcontacts,suchasrelays,switches,circuitbreakers,etc.,whereitisrequiredthatthecontactsdonotopenorclos
2、emomentarily,asapplicable,forlongerthanaspecifiedtime-duration(see4.3)underenvironmentaltestconditions,suchasvibration,shock,oracceleration.Thistestmethodprovidesstandardtestproceduresformonitoringsuch"openingofclosedcontacts"or"closingofopencontacts".1.目的:這測試執行確定在電器和電子零件部份有作切換電器接
3、觸時的接點抖動目的,如繼電器,開關,電流斷路器,等。接觸的地方不能有短暫的斷開或導通。如適用的環境試驗條件下,特定的持續長時間期間(見4.3),如:振動,衝擊或加速。這檢驗方法提供標準測試程序對於監測如”閉合接點打開”或”打開接點閉合”兩種測試電路。2.TESTCIRCUITS.2.測試電路2.1Selection.Inthismethodtherearetwotest-circuits:A(see3.1),andB(see3.2).Theselectionofthetest-circuitdependslargelyuponthetypeofelectr
4、icalcontactstobetested.Test-circuitBispreferred,wheneverpossible,toavoidcontactcontaminationcausedbytheformationofcarbonaceousdepositsonthecontacts.Theindividualspecificationshallspecifythetest-circuitandtime-duration(see4.3)requiredinconnectionwithmonitoringofshockandvibrationtes
5、ts.Thetest-circuitslistedhereinare"recommended"referencecircuits.Anycomparabletest-circuitwhichmeetsthetestrequirementsandthecalibrationproceduresasstatedherein,maybeusedforthistest.2.1選擇.這方法有兩個測試電路:A(見3.1),和B(見3.2)。測試電路的選擇取決於主要根據電氣接觸的類型來做測試。測試電路B是首選的,盡可能,以避免接觸形成的積炭造成的接觸污染。特定規格應註明
6、衝擊的監測和震動測試時測試電路和持續時間的要求。呈列於此的測試電路為建議的參考電路。任何類似的測試電路都應符合本文中指定的測試要求和校正程序,才能被用作使用測試。2.1.1Selectionoftest-circuitA.Test-circuitAisformonitoringtest-specimenswithasinglesetofcontacts,fortheopeningofnormally-closedcontactsorfalseclosuresofnormally-openedcontacts(seefigure310-1).Test-cir
7、cuitAshouldnotbespecifiedforspecimenswhosecapabilityincludeslow-levelordry-circuitratings(10milliamperesorlessand2voltsorlessforopeningsorclosingslessthan10microseconds);sincethecurrentthroughtheelectricalcontactsundertestfromthetest-circuitmaycausearcing,thusdamagingthecontacts.2
8、.1.1測試電路A的選擇。測試電路A是對於監測樣品-單一組連接設定
