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1、MaterialsSynthesis&Characterization:theroleofpositronannihilationInputMaterialsMaterialsSynthesis&CharacterizationKnownMaterialPropertiesSynthesis(Equilibrium/nonequilibriumMethods)ModifyStructure,Characterization/PhysicalandchemicalMicrostructure,Proper
2、tyPropertiesCompositionEvaluationApplication-NOorientedSuitable?Properties¾OpticalYES¾MagneticProducts/Components/¾ElectricalApplications¾MechanicalChemistryStructureMicrostructureProbesforMaterialscharacterization-Photons,Electrons,Protons,Neutrons,Ions
3、,PositronsHowDoWeCharacterise?∑GeneralAnalyticalTechnique-AverageInformationfromBulkmaterial,generallydestructive∑MicroscopyTechniques-SolidState,Nondestructive,ProbeBasedTechniques,PositionsensitiveSourceProbeResponseDetectorMaterialGeneralMethodologyof
4、CharacterisationClassificationofMaterialsCharacterizationStructuralChemicalCharacterisationCharacterisation¾Crystalstructure¾Chemicalnature¾Microstructure¾Macrochemicalanalysis¾Defectstructure¾Microchemicalanalysis¾Majorelement(>10%)¾Minorelement(0.1-10%
5、)¾Traceelement(1-1000ppm)¾Ultratrace(<1ppm)Abigcanvasofcharacterizationtechniques–Microstructural,StructuralandChemicalaspectsStructuralandChemicalMicrostructuralCharacterizationCharacterizationBulkstructure–XRD,TEM,Bulkcomposition–HRTEM,Neutronscatterin
6、gSpectrophotometry,MassspectroscopySurfacestructure–GIXRD,FIM,Surfacecomposition–AES,XPS,LEED,IonChanneling,STMSIMS,EPMA,RBSSurfacetopography–OpticalImpurities&localchemicalMicroscopy,SEM,AFM,Ellipsometryenvironment–MassSpectroscopy,ESR,NMR,Massspectrosc
7、opy,EPMA,AES,XPS,Microstructure(Impuritystates,SIMS,PIXE,Raman,PL,FTIR,PAC,Interstitials,Vacancies,ColorPAS,XRF,EXAFScentres,dislocations,Grainboundaries)–HRTEM,UVVIS,Raman,PL,FTIR,MS,PAC,PASMicrostructure(Cracks,Voids,Precipitates,Exclusions)–NDT,TEM,SA
8、XS,SANSMagneticStructure–Neutronscattering,MS,PACAdvancesinMaterialscharacterization,Eds.G.Amarendra,BaldevRaj,M.H.Manghnani,UniversitiesPress,Hyderabad,2007)AbbreviationsfortheexperimentaltechniquesAES-Augerelectronspectr
