MultiPrep 高氯化物含量的超粗化制程介绍

MultiPrep 高氯化物含量的超粗化制程介绍

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页数:9页

时间:2019-05-25

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1、CupricChloride-HydrochloricAcidMicroetchRougheningProcessanditsApplicationsKeshengFeng,NileshKapadia,BrianJobson,SteveCastaldiElectronicsSolutions,MacDermid,Inc.227FreightStreet,Waterbury,CT06702AbstractMultiPrepisacupricchloride-hydrochloricacidbasedmicroetchantprocessdeveloped

2、byMacDermid,Inc.basedinWaterbury,CT.Thisprocessprovidesauniqueroughenedcoppersurface,whichyieldsexcellentadhesionforbothsoldermaskanddryfilmphotoresistapplications.Theprocessalsoyieldsexcellentsoldermaskadhesionthroughsubsequentsilver,tinandnickelplatingpostsoldermaskapplication

3、.Theamountofcopperetchedusingcupricchloride-hydrochloricacidbasedmicroetchantisnotashighasthatseentypicallyincupricchlorideetchingsystems.Airborneoxygenisefficientenoughtobeusedasanoxidizerinthesystem.Hydrochloricacidmaintainstheproperhydrogenandchlorideionconcentrations.Thecupr

4、icionmaintainsitselfthroughouttheprocess.Thechemistryandprocessarebotheasilycontrolled.Theprocessoperationiscomparabletoaminicupricchlorideetcher,wherebycopperconcentrationismaintainedbyspecificgravityandaciditycanbecontrolledbyconductivity.Itisnotnecessarytocontroloxidation-red

5、uctionpotential,hencethedifferenceascomparedtoconventionaletchingprocesses.ThistechnologyprovideshighlyroughenedcoppersurfacesforconventionalacidplatedcoppersuchasPPRandDC,andstandardregularcopperclad,whichoffersgreatadhesionforsoldermaskanddryfilmphotoresist.Forsoldermaskapplic

6、ations,itisnecessarytoproducearoughertopographybycontrollingmicroetchingrateat1.0-1.5µm/mtogetgoodadhesionbetweencoppersurfaceandsoldermaskwhenthefinalfinishisinvolvedinimmersionorelectrolessplatingprocesswithtinornickel.Fordryfilmphotoresistapplications,theprocessedcoppersurfac

7、eisroughenoughtoimprovetheadhesionatmicroetchingratebelow1.0µm/m.Thecoppersurfaceroughnessshouldbecontrolledwithinarangetobalancetheadhesionandresolutionwhendryfilmphotoresistisusedforfinelineboards.1IntroductionAtElectronicCircuitsWorldConvention11Conference,Shanghai,China,Marc

8、h17-19,2008,anewmicroetchingchemistry,cupricchl

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