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ID:36344569
大小:4.20 MB
页数:65页
时间:2019-05-09
《CuO和TiO2纳米结构薄膜的电阻开关性质的研究》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、河南大学硕士学位论文CuO和TiO<,2>纳米结构薄膜的电阻开关性质的研究姓名:赵文超申请学位级别:硕士专业:凝聚态物理指导教师:张兴堂20090601纳米颗粒薄膜及有关文献报道非常不同的实验现象。至今,我们还没有找到合适的理论模型去分析我们得到的实验现象和讨论其输运机制。也许以后在对其进行更深入的研究后能使我们得以解释这种现象关键词:CuO;Ti02纳米介孔薄膜;电阻开关:空间电荷限制电流(SCLC)AbstractWhiletraditionalmemoriesareapproachingtheirsc
2、alinglimits,thenextgenerationnonvolatilememoryhasattractedextensiveattention.Oneofthepromisingcandidatesistheresistiverandomaccessmemory(RRAM)duetoitssuperiorcharacteristicsincludingsimplestructure,highdensityintegration,lowpowerconsumption,andfastwrite/er
3、aseoperation.Recently,resistiveswitchinginsimplebinarytransitionmetaloxidethinfilms,suchasCuOandTi02,attractsgreatinterestforapossibleapplicationinnonvolatilememorydevices.Inthisletter,wehavemostlyinvestigatedtheresistiveswitchingpropertiesofCuOnanostructu
4、regrainFilmsandTi02nanostructuremesoporousthinfilms.InChapter2,thecopperoxidethinfilmsweredepositedongalssfloorbyionicsheafspatterwithhightemperatureannealingmethod.Wehavestudiedthesurfacemorphology,crystallinephasesandchemistryvaluebyatomicDFMmodelofscann
5、ingprobemicroscope(SPM),x-raydiffraction(XRD)andx-rayphotoelectronspectroscopy(XPS).WealsohavestudieditsphotoswitchingpropertiesbyC-AFMmodelofscanningprobemicroscope(SPM).InChapter3,wehaveinvestigatedthehysteretic/-VcharacteristicsofAu/CuO/Auheterostructur
6、es.SCLconductioncontrolledbyAu/CuOinterfacetrapswithexponentialdistributioninenergyisemployedtodescribethecarriertransportprocess.Thehysteresisisobservedwhenthecardertrappinglevelcomestothesituationinwhichthe/-VcurvesshowtheTFLconductionmechanism,andCanbea
7、ttributedtoretentionpropertyoftrappedcarriers.ThehighandlowresistancestatesinducedbyvoltagepulsesarealsodependentonthecardertrappinglevelsandtheresistanceswitchingCanberegardedasthechangesoftrapleveldistributioncausedbytrapping/detrappingprocessofholecarri
8、ers.ThisSCLconductionisattributedtointerfaceinducedbulklikelimitedeffectbecausethetrapsdominatingthecardertransportarelocatedattheAu/CuOinterface.Carriersfilledtrapswithexponentialdistributioninenergyshowthen
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