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ID:25203066
大小:6.27 MB
页数:31页
时间:2018-11-18
《electronics for the lhcb outer tracking detector》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、ElectronicsfortheLHCbOuterTrackingDetectorDirkWiednerPhysicsInstituteUniversityofHeidelbergGermanyLHCbTracking:ImpactmeasurementCERNSwitzerlandOuterTrackerIonisingparticle200μmresolutionElectronicsPlacementOTISGOLASDBLROTISHVboardsASDBLRASDBLRLVRegL1TFCECSLVHVFrontend
2、box:128channels16ASDBLRamplifiers4OTISTDCchips1opticallink:1.6Gbit/sOuterTracker:3Stations56000channels432FEboxes=432opticallinksTFCTFCECSECSPower(HV,LV)Power(HV,LV)TFCTFCECSECSPower(HV,LV)Power(HV,LV)FiberstoL1BufferFiberstoL1BufferFiberstoL1BufferFiberstoL1Buffertot
3、.dose<10kradElectronicsSchemeASDOTIS-TDCL0Buffer0-Supp.thresholdFastControl200fCDAQ(PCs)countingroom~100mFEElectronicsonthedetectorGOLElectronicsServiceBoxPower/ControlAmplifierTDCopticallinkElectronicComponentsinFE-BoxGOLASDASDASDASDHV-BoardHV-BoardTDCTDCGOL:Gigabit
4、OpticalLinkOTIS:OuterTrackerTimeInformationSystemASD:AmplifierShaperDiscriminatorHV:HighVoltagex1x4x8x4432FE-BoxesHV-BoardsCapacitors:JOHANSON302R29W331KV4EMax.Volt.:4kVSize:4.6x2x1.5mm3R=1MΩC=330pFZ=316Ω32channels/boardCompactcapacitorsOperationinaircasting/embedding
5、ofcapsCastingembeddingTechnologySeveretechnologicalproblemsinthebeginning:ImperfectsolderingprocedureHandre-workMechanicalstressanddamageofcapsMeanwhile(severaliterations)technologyiswellunderstoodProductionTesting56HVboardsV5*:testedfor48h@70oC,2500V2failingcap(Ileak
6、>100A)6moreboardsdiscardedAllothercaps:<1nA/capSatisfyingresult*)allchannelscarefullymonitoredduringtheproductionYieldof80%expected,85%yieldreachedalreadyASDBoardTDCHVBoardAmplifierShaperDiscriminatorwithBaseLineRestoration~10nsshapingtime1fCsensitivity8channelsDesig
7、nedforATLASdetectorTotalneedof7200chips28896chipsavailableGroundspringsASDBLRTestingChipscategorized:pre-selection:currentconsumptionbrokenchannelsetc.→62.2%acceptedperformance:thresholdspreadchecked→32%bestchipschosenHalfEfficiencyVthr[50%]Eff0.5OTISTDC32channelASICT
8、DC1nsdrifttimeresolution75nsmax.drifttimesingleandmulti-hitradiationtolerantonchipL0buffer2000TDCsneededOTISWaferTest47wafer
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