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1、CMOSSRAMCircuitDesignandParametricTestinNano-ScaledTechnologiesFRONTIERSINELECTRONICTESTINGConsultingEditorVishwaniD.AgrawalBooksintheseries:NanometerTechnologyDesigns¢HighQualityDelayTestsTehranipoor,M.,Ahmed,N.,Vol.38ISBN978-0-387-76486-3EmergingNanotechnologies¢Test,DefectTolerance
2、,andReliabilityTehranipoor,M.(Ed.),Vol.37ISBN978-0-387-74746-0Oscillation-BasedTestinMixed-SignalCircuitsHuertasSánchez,G.,VázquezGarcíadelaVega,D.(etal.),Vol.36ISBN:978-1-4020-5314-6TheCoreTestWrapperHandbookdaSilva,Francisco,McLaurin,Teresa,Waayers,Tom,Vol.35ISBN:0-387-30751-6Defect
3、-OrientedTestingforNano-MetricCMOSVLSICircuitsSachdev,Manoj,PinedadeGyvez,José,Vol.34ISBN:978-0-387-46546-3DigitalTimingMeasurements–FromScopesandProbestoTimingandJitterMaichen,W.,Vol.33ISBN0-387-32418-0Fault-ToleranceTechniquesforSRAM-basedFPGAsKastensmidt,F.L.,Carro,L.(etal.),Vol.32
4、ISBN0-387-31068-1DataMiningandDiagnosingICFailsHuisman,L.M.,Vol.31ISBN0-387-24993-1FaultDiagnosisofAnalogIntegratedCircuitsKabisatpathy,P.,Barua,A.(etal.),Vol.30ISBN0-387-25742-XIntroductiontoAdvancedSystem-on-ChipTestDesignandOptimi...Larsson,E.,Vol.29ISBN:1-4020-3207-2EmbeddedProces
5、sor-BasedSelf-TestGizopoulos,D.(etal.),Vol.28ISBN:1-4020-2785-0AdvancesinElectronicTestingGizopoulos,D.(etal.),Vol.27ISBN:0-387-29408-2TestingStaticRandomAccessMemoriesHamdioui,S.,Vol.26ISBN:1-4020-7752-1VerificationbyErrorModelingRadecka,K.andZilic,Vol.25ISBN:1-4020-7652-5ElementsofST
6、IL:PrinciplesandApplicationsofIEEEStd.1450Maston,G.,Taylor,T.(etal.),Vol.24ISBN:1-4020-7637-1FaultInjectionTechniquesandToolsforEmbeddedSystemsReliabilityEvaluationBenso,A.,Prinetto,P.(Eds.),Vol.23ISBN:1-4020-7589-8Power-ConstrainedTestingofVLSICircuitsNicolici,N.,Al-Hashimi,B.M.,Vol.
7、22BISBN:1-4020-7235-XHighPerformanceMemoryTestingAdams,R.Dean,Vol.22AISBN:1-4020-7255-4AndreiPavlov¢ManojSachdevCMOSSRAMCircuitDesignandParametricTestinNano-ScaledTechnologiesProcess-AwareSRAMDesignandTestABCAndreiPavlovManojSachdevIntelCorporationUniversityofWaterloo2501NW229thStreet
8、Dept.
