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1、ReliabilityofComputerSystemsandNetworks:FaultTolerance,Analysis,andDesignMartinL.ShoomanCopyright2002JohnWiley&Sons,Inc.ISBNs:0-471-29342-3(Hardback);0-471-22460-X(Electronic)RELIABILITYOFCOMPUTERSYSTEMSANDNETWORKSRELIABILITYOFCOMPUTERSYSTEMSANDNETWORKSFaultTolerance,Analysis,andDesign
2、MARTINL.SHOOMANPolytechnicUniversityandMartinL.Shooman&AssociatesAWiley-IntersciencePublicationJOHNWILEY&SONS,INC.Designationsusedbycompaniestodistinguishtheirproductsareoftenclaimedastrademarks.InallinstanceswhereJohnWiley&Sons,Inc.,isawareofaclaim,theproductnamesappearininitialcapital
3、orALLCAPITALLETTERS.Readers,however,shouldcontacttheappropriatecompaniesformorecompleteinformationregardingtrademarksandregistration.Copyright2002byJohnWiley&Sons,Inc.,NewYork.Allrightsreserved.Nopartofthispublicationmaybereproduced,storedinaretrievalsystemortransmittedinanyformorbyany
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5、nsDepartment,JohnWiley&Sons,Inc.,605ThirdAvenue,NewYork,NY10158-0012,(212)850-6011,fax(212)850-6008,E-Mail:PERMREQ@WILEY.COM.Thispublicationisdesignedtoprovideaccurateandauthoritativeinformationinregardtothesubjectmattercovered.Itissoldwiththeunderstandingthatthepublisherisnotengagedinr
6、enderingprofessionalservices.Ifprofessionaladviceorotherexpertassistanceisrequired,theservicesofacompetentprofessionalpersonshouldbesought.ISBN0-471-22460-XThistitleisalsoavailableinprintasISBN0-471-29342-3.FormoreinformationaboutWileyproducts,visitourwebsiteatwww.Wiley.com.ToDanielleLe
7、ahandAvivaZisselCONTENTSPrefacexix1Introduction11.1WhatisFault-TolerantComputing?,11.2TheRiseofMicroelectronicsandtheComputer,41.2.1ATechnologyTimeline,41.2.2Moore’sLawofMicroprocessorGrowth,51.2.3MemoryGrowth,71.2.4DigitalElectronicsinUnexpectedPlaces,91.3ReliabilityandAvailab