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1、TransienTelecTronicsThermallytriggereddegradationoftransientelectronicsisaccomplishedbyS.R.Whiteandco-workersusingprotectivewaxcoatingsthatmeltandreleaseencapsulatedacidmicrodroplets,asdescribedonpage3783.Aself-destructivedeviceisshown,whereheattriggeringisremotelycontrolled
2、.Theheaterofthedeviceiswirelesslypoweredthroughinductivecoupling,andsubsequentmeltingofthewaxthenleadstorapiddevicedestructionviaacidicdegradationoftheelectroniccomponents.ADMA-27-25-Frontispiece.indd115/06/153:36PMwww.advmat.dewww.MaterialsViews.comCOMMUNICATIONThermallyTri
3、ggeredDegradationofTransientElectronicDevicesChanWooPark,Seung-KyunKang,HectorLopezHernandez,JoshuaA.Kaitz,DaeSeungWie,JihoShin,OliviaP.Lee,NancyR.Sottos,JeffreyS.Moore,JohnA.Rogers,andScottR.White*Electronicsthatdisintegrateafterstableoperationforadesiredcyclicpoly(phthalal
4、dehyde)(cPPA)(T=43°C).[6]Filmsofcamountoftimeareofgreatinterestforbiomedicalimplants,cPPAwerepreparedcontainingphotoacidgeneratorsandsecurememorydevices,andenvironmentalsensors.[1–6]Tran-UV-triggeringpromotedacid-catalyzeddepolymerizationofsientelectronicshavebeendemonstrate
5、dwithhydrolyzablecPPA,ultimatelyresultinginsubstratedisintegrationandthininorganiccomponentssuchassiliconnanomembranedevicedestructionwithin20min.Here,weseektopro-semiconductors,[1–3]variousmetals(e.g.,Mg,Mo,etc.)elec-videeasierdevicefabrication,fasterdevicedestruction,andtr
6、odes,[4]andMgO,SiOorSiNdielectrics.[1,5]Exposureoftheexpandthetypesoftriggeringmodesfortransience.Among2xdevicetoaqueousconditionsleadstothesubsequentdissolu-variousstimuli-responsivesystems,heattriggershavebeentionofthepackagingthatprotectscircuits.Thetimescaleofwidelystudi
7、edwiththermo-sensitivematerialsincludingtransienceiscontrolledbythedissolutionrateofwater-solublephase-changeandvolume-changematerialsfordrugpolymersubstratessuchassilkandpoly(vinylalcohol)whichdelivery,membranes,andbatteryshutdown.[1,11,12]Notably,varybasedonthickness,cryst
8、allinity,anduseoffillers.[1,7]thethermalactivationcanbecoupledwithothertrigg