欢迎来到天天文库
浏览记录
ID:49883530
大小:1.22 MB
页数:95页
时间:2020-03-05
《IEEE Recommended Practice for Excitation System Models for Power System Stability Studies.pdf》由会员上传分享,免费在线阅读,更多相关内容在应用文档-天天文库。
1、IEEERecommendedPracticeforExcitationSystemModelsforPowerSystemStabilityStudiesIEEEPowerEngineeringSocietySponsoredbytheEnergyDevelopmentandPowerGenerationCommitteeIEEEIEEEStd421.5™-20053ParkAvenue(RevisionofNewYork,NY10016-5997,USAIEEEStd421.5-1992)21April2006Authorizedlicenseduselimitedto:
2、ZhejiangUniversity.DownloadedonJune12,2013at07:49:02UTCfromIEEEXplore.Restrictionsapply.Authorizedlicenseduselimitedto:ZhejiangUniversity.DownloadedonJune12,2013at07:49:02UTCfromIEEEXplore.Restrictionsapply.RecognizedasanIEEEStd421.5™-2005AmericanNationalStandard(ANSI)(RevisionofIEEEStd421.
3、5-1992)IEEERecommendedPracticeforExcitationSystemModelsforPowerSystemStabilityStudiesSponsorEnergyDevelopmentandPowerGenerationCommitteeoftheIEEEPowerEngineeringSocietyApproved29December2005AmericanNationalStandardsInstituteApproved25October2005IEEE-SAStandardsBoardAbstract:Excitationsystem
4、modelssuitableforuseinlarge-scalesystemstabilitystudiesarepresented.Importantlimitersandsupplementarycontrolsarealsoincluded.Themodelstructurespresentedareintendedtofacilitatetheuseoffieldtestdataasameansofobtainingmodelparameters.Themodelsare,however,reducedordermodelsanddonotrepresentallo
5、fthecontrolloopsonanyparticularsystem.Themodelsarevalidforfrequencydeviationsof±5%fromratedfrequencyandoscillationfrequenciesupto3Hz.Thesemodelswouldnotnormallybeadequateforuseinstudiesofsubsynchronousresonanceorothershafttorsionalinteractionproblems.Delayedprotectiveandcontrolfeaturesthatm
6、aycomeintoplayinlongtermdynamicperformancestudiesarenotrepresented.Asamplesetofdataforeachofthemodels,foratleastoneparticularapplication,isprovided.Keywords:excitationlimiters,excitationsystems,powersystemstabilityAuthorizedlicenseduselimitedto:ZhejiangUniversity.DownloadedonJune12,2013at07
7、:49:02UTCfromIEEEXplore.Restrictionsapply.TheInstituteofElectricalandElectronicsEngineers,Inc.3ParkAvenue,NewYork,NY10016-5997,USACopyright©2006bytheInstituteofElectricalandElectronicsEngineers,Inc.Allrightsreserved.Published21April2006.PrintedintheUnite
此文档下载收益归作者所有