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ID:41224038
大小:306.50 KB
页数:43页
时间:2019-08-19
《FieldEffectTransistors(FETs)场效应晶体管(FET)》由会员上传分享,免费在线阅读,更多相关内容在教育资源-天天文库。
1、FieldEffectTransistors(FETs)Inafieldeffecttransistor,currentflowthroughasemiconductorchanneliscontrolledbytheapplicationofanelectricfield(voltage)perpendiculartothedirectionofcurrentflow.WeconsidertheMOSFET(MOST)-themetaloxidesemiconductor(fieldeffect)
2、transistor.FieldEffectTransistors(FETs)InadepletionmodeMOSFETachannelisbuiltinsothatconductionoccurswithnocontrolvoltageapplied.Weconsiderann-channelenhancementmodedevicewhichhasno‘built-in’conductionchannel.N-channelenhancementmodeMOSFET(schematic)Oxi
3、de(SiO2)n+n+p-typesiliconGate(G)Drain(D)Source(S)SymbolforN-channelenhancementmodeMOSFETNoteconnectiontosubstrateshownSymbolforN-channelenhancementmodeMOSFETNoteconnectiontosubstrateshownGSDN-channelenhancementmodeMOSFET:outlineofoperationVGS=0,littleo
4、rnocurrentcanflowSD,backtobackp-njunctions.AsapositiveVGSisapplied,holesinthep-regionarerepelled.AsVGSincreasesfurther,electronsareattractedfromthesubstratetowardsthepositivegate.Aninversionlayerofmobileelectronsformsnearthesiliconsurface.N-channelenh
5、ancementmodeMOSFETwithinversionlayerSource(S)Oxide(SiO2)n+n+p-typesiliconGate(G)Drain(D)Inversionlayer(conductionchannel)N-channelenhancementmodeMOSFET:outlineofoperationThisinversionlayeriseffectivelyn-type.Electronscancarrycurrentinancontinuousn-type
6、path(orchannel)fromsourcetodrain.TheconductionchannelformswhenVGSattainsathresholdvoltage,VTN-channelenhancementmodeMOSFETThevalueofVTisdeterminedbythedeviceprocessandthelevelofthep-type(substrate)doping.Notethatann-channeldeviceisformedwithap-typesubs
7、trate.N-channelenhancementmodeMOSFETAsVGSincreasesfurther,moreelectronsaredrawnintotheinversionlayerandthechannelresistancedecreases(Thedeviceoperatesasavoltagecontrolledresistor).However……N-channelenhancementmodeMOSFETThevoltagebetweengateandchannelva
8、riesfromVGSatthesourceendtoVGS-VDSatthedrainend.Thusasthevoltageatthedrainend,VDS,isincreasedtheeffectivegate-channelvoltage(verticalfield)isdecreased.N-channelenhancementmodeMOSFETThiscausesthecarrierdensityatthedrainendoftheinversionl
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