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1、PhysicalPrinciplesofElectronMicroscopy生物秀-专心做生物！www.bbioo.cmRayF.EgertonPhysicalPrinciplesofElectronMicroscopyAnIntroductiontoTEM,SEM,andAEMWith122FiguresRayF.EgertonDepartmentofPhysics,UniversityofAlberta412AvadhBhatiaPhysicsLaboratoryEdmonton,Alberta,CanadaT6G2R3LibraryofCongressControl
2、Number:2005924717ISBN-10:0-387-25800-0Printedonacid-freepaper.ISBN-13:978-0387-25800-0©2005SpringerScience+BusinessMedia,Inc.Allrightsreserved.Thisworkmaynotbetranslatedorcopiedinwholeorinpartwithoutthewrittenpermissionofthepublisher(SpringerScience+BusinessMedia,Inc.,233SpringSt.,NewYork
3、,NY10013,USA),exceptforbriefexcerptsinconnectionwithreviewsorscholarlyanalysis.Useinconnec-tionwithanyformofinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilarmethodologynowknownorhereafterdevelopedisforbidden.Theuseinthispublicationoftradenames,tr
4、ademarks,servicemarks,andsimilarterms,eveniftheyarenotidentifiedassuch,isnottobetakenasanexpressionofopinionastowhetherornottheyaresubjecttoproprietaryrights.PrintedintheUnitedStatesofAmerica.(EB)987654321springeronline.comToMaiaContentsPrefacexi1.AnIntroductiontoMicroscopy11.1Limitations
5、oftheHumanEye21.2TheLight-OpticalMicroscope51.3TheX-rayMicroscope91.4TheTransmissionElectronMicroscope111.5TheScanningElectronMicroscope171.6ScanningTransmissionElectronMicroscope191.7AnalyticalElectronMicroscopy211.8Scanning-ProbeMicroscopes212.ElectronOptics272.1PropertiesofanIdealImage
6、272.2ImaginginLightOptics302.3ImagingwithElectrons342.4FocusingPropertiesofaThinMagneticLens412.5ComparisonofMagneticandElectrostaticLenses432.6DefectsofElectronLenses443.TheTransmissionElectronMicroscope573.1TheElectronGun583.2ElectronAcceleration67viiiContents3.3Condenser-LensSystem703.
7、4TheSpecimenStage753.5TEMImagingSystem783.6VacuumSystem884.TEMSpecimensandImages934.1KinematicsofScatteringbyanAtomicNucleus944.2Electron-ElectronScattering964.3TheDynamicsofScattering974.4ScatteringContrastfromAmorphousSpecimens1014.5DiffractionContrastfromPolycrys
