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1、Chapter24AReviewofInSituEBSDStudiesStuartI.WrightandMatthewM.Nowell24.1Introductionprecededand/orfollowedbyOIManalysis;second,deformationexperimentsinwhichatensilestageismountedinthemicroscopeandOIMscansarecol-Inthefirstfullyautomatedelectronbackscatterlectedwiththesampleheldunder
2、tensionatspecifieddiffraction(EBSD)system(WrightandAdams1992),pointsalongthestress-straincurve;third,heatinglatertermedorientationimagingmicroscopy(OIM)experimentsinwhichscansarecollectedwiththe(Adamsetal.1993),foursecondswererequiredtosampleheldattemperatureatspecificpointsalongai
3、ndexeachEBSDpattern.Afewinsitustudieswereheating-coolingcurveortime-temperaturecurve;andperformedusingtheseearlysystemsinvolvingaten-fourth,experimentsperformedusingastagecapablesilestage(Weilandetal.1996)andaheatingstageofbothdeformationandheating.Anothertypeofin(HumphreysandFer
4、ry1996).Whilethiswasabigsituworkisthecollectionofthree-dimensionaldatastepforward,moderncommercialsystemsarecapa-throughserialsectioning.Thisisnowpossiblewiththebleofspeedsoverthreeordersofmagnitudefaster.adventofmicroscopesinwhichtheSEMiscombinedFortunately,whileautomatedEBSDtec
5、hnologywaswithafocusedionbeam(FIB).However,suchworkadvancing,scanningelectronmicroscope(SEM)tech-willnotbecoveredinthischapter,becauseChapters8,nologywasalsoadvancing.Fieldemissiongunbased9,and10discusssuchworkindetail.SEMsbecamewidelyavailable.Thesmaller,moreWhilemanyexamplesofi
6、nsituOIMworkwillbeintensebeamsinthesemicroscopesenabletheOIMcitedinthisreview,thereferencesarenotcomprehen-techniquetobeappliedathigherspatialresolutionssive.Nonetheless,anefforthasbeenmadetocitestud-andfasterdatacollectionspeeds.Theseimprovementsiesdonebyalloftheresearchgroupsac
7、tiveinthishavemadeOIMsystemsmorecapableofcapturingthearena,aswellasacrossthespectrumofapplications.evolvingmicrostructuresduringinsituexperiments.InordertoperformOIMscansduringinsituexper-SomeinformationcanbegleanedfromindividualimentsintheSEM,thesampleshouldbetiltedtothepatterns
8、obtainedwithastationarybeamduringin◦◦sta
