MEMS packaging and reliability

MEMS packaging and reliability

ID:39505779

大小:4.22 MB

页数:76页

时间:2019-07-04

MEMS packaging and reliability_第1页
MEMS packaging and reliability_第2页
MEMS packaging and reliability_第3页
MEMS packaging and reliability_第4页
MEMS packaging and reliability_第5页
资源描述:

《MEMS packaging and reliability》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库

1、ESS480000微系統工程原理Lecture10:Lecture10:Lecture10:微系統封裝及可靠度微系統封裝及可靠度微系統封裝及可靠度(MEMSPackagingandReliability)(MEMSPackagingandReliability)(MEMSPackagingandReliability)饒達仁助理教授饒達仁助理教授(Da(Da--JengJeffreyYao)JengJeffreyYao)國立清華大學微機電系統工程研究所國立清華大學微機電系統工程研究所1WhyWorryAboutPackaging?•Thepackageisi

2、ntegraltothefinalproduct•Youdon’thaveaproductuntilitsinapackage•Packageis40-80%ofproductcost•Costumedpackagingsolutionshavelongleadtime•Packagingdesignmustbeapartofproductdesign,notanafterthough•Designformanufacture&concurrentengineering•Considerproducttrade-offsupfront2ICPackageRe

3、liability•Problemsinpackagingaffectyourbottomline!•ICworldhas40yearsonthelearningcurve•MEMShasessentiallynone!•So,wemustlearnwhatwecanfromICworld3Microelectronic(IC)Packaging•Mechanicalsupportbysiliconsubstrate•Electricconnection–Withoutwiring,ICisuseless–Powerdistribution(layout)•

4、Thermalmanagement–Heatdissipationproblem•Protectionfromenvironment–Lifetimeandreliability•Variabilityofpackagingstyles–DIP,TAB,BGA,flip-chip,etc…–Cost,performance,andsizetrade-offs4MoreComplicatedMEMSPackaging•Bothelectricalandmechanicalparts•Lessthermalissueproblem,ingeneral•SomeM

5、EMSmaybeisolatedfromenvironment,somemightneedtointeractwithsurroundings•Someoftheissues–Gasorfluidicinterconnects–Fiber/opticsinterconnectsorintegration–Vacuumpackaging–Precisionalignment(accelerometer,opticalswitches)•Takewhatwecan,figurehowtodotherest!•Bigquestioniswhentodotherel

6、easeetching?5AnOverviewofPackagingProcess•Waferlevelfunctionaltest•Separateintoindividualdie(chip)•Mechanicallyattachtopackageorchipcarrier(diebonding)–Singlechipmoduleormultichipmodule–Electricallyattachtopackage(wirebonding)•Enclose,encapsulate,sealpackage•Functionaltestatpackage

7、level•Sell6WaferLevelICTest•AutomatedtestersdeterminewhichICsaregood–Don’twanttopackagebadchips($$$)–Labelpackageproperly(chipspeed=$$$)•TestingMEMSfunctionalityrequiresreleasedMEMSstructure–CurrenttestersnotcompatiblewithMEMS•WhatcouldreplacewafertestforMEMS?–Electricalteststructu

8、resprobedbeforerelease?–Te

当前文档最多预览五页,下载文档查看全文

此文档下载收益归作者所有

当前文档最多预览五页,下载文档查看全文
温馨提示:
1. 部分包含数学公式或PPT动画的文件,查看预览时可能会显示错乱或异常,文件下载后无此问题,请放心下载。
2. 本文档由用户上传,版权归属用户,天天文库负责整理代发布。如果您对本文档版权有争议请及时联系客服。
3. 下载前请仔细阅读文档内容,确认文档内容符合您的需求后进行下载,若出现内容与标题不符可向本站投诉处理。
4. 下载文档时可能由于网络波动等原因无法下载或下载错误,付费完成后未能成功下载的用户请联系客服处理。