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ID:36813942
大小:4.46 MB
页数:46页
时间:2019-05-15
《AlGaNGaN异质结材料特性与HEMT器件研究》由会员上传分享,免费在线阅读,更多相关内容在学术论文-天天文库。
1、摘要摘要常规半导体微波功率器件已经发展到其性能极限。为了满足无线通信的未来需求,宽禁带半导体GaN和SiC成为研究的热点。AIGaN/GaNHEMT器件被认为是1.50GHz频率范围内的理想的微波功率器件。然而,目前AlGaN/GaNHEMT器件物理和工艺技术还不成熟。本文即在此背景下写作的。首先,基于ISETCAD模拟结果以及文献中的大量数据,分析了AIGaN/GaN异质结中影响2DEG的因素,如A1GaN势垒层极化、Al组分、应变、厚度以及掺杂等。基于静电学分析,抓住主要矛盾忽略了一些细节,得出了
2、表面态是异质结中2DEG的来源。基于这一分析结果解释了模拟和文献中的大量数据。最后根据建立物理理论的基本方法对得出的结论进行系统的分类。其次,基于对异质结的深入理解,建立了A1GaN/GaNHEMT的直流特性解析模型。最后,研究了A1GaN/GaNHEMT的电流崩塌效应。着重阐述了应力模型、虚栅模型等几种解释电流崩塌效应形成机理的模型以及表面处理、场板结构、生长盖冒层等减少电流崩塌的措施。关键词:AIGaN/GaN异质结构高电子迁移率晶体管电流崩塌AbstractMicrowavepowerdevic
3、eswitllconventionalsemiconductorshaveapproachedtheirperformancelimits.Microwavepowerdevices、析tllconventionalsemiconductorshaveapproachedtheirperformancelimits.Tomeetthefutureneedinwirelesscommunications,researchefforthasbeendirectedtowidebandgapsemicond
4、uctors,suchasGaNandSiC.A1GaN/GaNHigh-Electron-Mobility—Transistors(HEMT)areregardedastheidealmicrowavepowerdevicesin1-50GHzfrequencyrange.HoweveLthedevicephysitsandthefabricationtechnologyofA1GaN/GaNHEMTremainimmature.Thisdissertationiswritteninthebackg
5、round.A1GaN/GaNHigh·-Electron··Mobility·-Transistors(HEMT)areregardedastheidealmicrowavepowerdevicesin1-50GHzfrequencyrange.However,thedevicephysicsandthefabricationtechnologyofA1GaN/GaNHEMTremainimmature.ThisdissertationiswriReninthebackground.Firstly,
6、basedontheresultsofISETCADsimulationandalargeamountsofpublisheddata,analysisofmanyfactorstllatinfluenceonthedensityoftwodimensionalelectrongassuchaspolarity,alloycomposition,strain,thickness,anddopingoftheA1GaNbarrier.Basedontheelectrostaticsanalysis,re
7、gardlessofthedetailstoseizethemainpoints,surfacestatesareidentifiedasanimportantsourceofelectronsisobtained.TheresultsofISETCADsimulmionandalargeamountofpublisheddataareinterpretedbythistheory.Then,theconclusionsareclassifiedbymethodoftheestablishmentof
8、theoreticalphysics.Secondly,basedonthedeepresearchofAlGaN/GaNheterostructm'es,ananalyticalmodelfortheDCcharacteristicsofAlGaN/GaNHEMTisdeveloped.Finally,currentcollapseofA1GaN/GaNHEMTisresearched.Thereasoncausedthecurrentcollapse
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