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ID:36551829
大小:2.09 MB
页数:54页
时间:2019-05-12
《磁控溅射复合金属氮化物薄膜和纳米多层膜的摩擦磨损性能》由会员上传分享,免费在线阅读,更多相关内容在行业资料-天天文库。
1、浙江大学硕士学位论文磁控溅射复合金属氮化物薄膜和纳米多层膜的摩擦磨损性能姓名:顾斌申请学位级别:硕士专业:材料科学与工程指导教师:涂江平20070601浙江大学硕£学位论文AbstractOwningtothehighhardness,goodoxidationresistanceandmanyotherexcellentproperties,transitionmetalnitridenano-cumpositeandnano-multilayeredfilmsCallimproveperformanceofcuttingt
2、oolsandextendtheirlife-spans,whichwouldresultinpromisingprospectsinindustrialapplication.Uponthis,thepresentworkisdedicatedtoimprovethetribologicalpropertiesofthefilms.Ti-Si-NnaonocompositefilmsandCr-W-N,Cr-Mo-NseriesfilmswerefabricatedthroughDCmagnetronsputtering.E
3、ffectsofdepositionparametersonmierostrueture,adhesionstrengthandtribologicalpropertieswereinvestigatedtoobtaintheoptimaldepositioncondition.Compositetargets,withSiembeddedinTitargets,wereusedtodepositTi-Si-Ncompositefilmswhilesubstratetemperature,biasandpowerdensity
4、wereconstant.Themicrostruemre,morphologyofcross-sectionand$nrface,chemicalcomponentofcompositefilmswerecharacterizedbyX-raydiffxaction(XRO),high-resolutiontransmissionelectronmicroscope(HRTEM),scanningelectronmicroscope(SEM),atomicforcemicroscope(AFM)andenergydisper
5、siveX-rayspectroscope(EDS)respeetivdy.Scratchtestswereappliedtodeterminetheadhesionstrengthofas-depositedfilms.Thetribologiealbehaviorwasinvestigatedusingaball·on-disktribometerinbotllvacuumandhumidair.Therelationshipbetweenmicrosturcture,morphology,propertiesanddep
6、ositionpressurewerealsodiscussed.ItwasfoundthatthecompositestruetureofTi-Si-Nfilms,nanocrystallineTiNembeddedinamorphousSi3N4matrix,wasconfirmedinthiswork.Theincreasingdepositionpressureresultedintheappearanceofcolumnarstructure,decreaseinthefilmdensity,increaseinth
7、esurfaceroughness,anddeteriorationoftheadhesionstrengthandtribologicalproperties.TheadditionofSiinthecompositefilmscouldimprovethetribologiealperformanceofthefilms.髓eCr-W-N.Cr-Mo-Nseriesfilmswerealsodepositedbymagaetronco-sputteringusingpuremetaltargets。Thevariation
8、ofthestructureWasachievedbyalteringrotationvelocityofthesubstrateholder.MicrostruetureandmorphologyofthefilmsWCI"echaracterizedbyXRD,SEM.R
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