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1、Post-SiliconandRuntimeVerificationforModernProcessorsIlyaWagnerValeriaBertacco•Post-SiliconandRuntimeVerificationforModernProcessorsIlyaWagnerValeriaBertaccoPlatformValidationEngineeringGroupDepartmentofElectricalEngineeringIntelCorporationandComputerScienceHillsboro,OregonUniversityofMichi
2、ganUSAAnnArbor,Michiganilya.wagner@intel.comUSAvaleria@umich.eduISBN978-1-4419-8033-5e-ISBN978-1-4419-8034-2DOI10.1007/978-1-4419-8034-2SpringerNewYorkDordrechtHeidelbergLondon©SpringerScience+BusinessMedia,LLC2011Allrightsreserved.Thisworkmaynotbetranslatedorcopiedinwholeorinpartwithoutthe
3、writtenpermissionofthepublisher(SpringerScience+BusinessMedia,LLC,233SpringStreet,NewYork,NY10013,USA),exceptforbriefexcerptsinconnectionwithreviewsorscholarlyanalysis.Useinconnectionwithanyformofinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilarmet
4、hodologynowknownorhereafterdevelopedisforbidden.Theuseinthispublicationoftradenames,trademarks,servicemarks,andsimilarterms,eveniftheyarenotidentifiedassuch,isnottobetakenasanexpressionofopinionastowhetherornottheyaresubjecttoproprietaryrights.Printedonacid-freepaperSpringerispartofSpringer
5、Science+BusinessMedia(www.springer.com)TomynieceEllie,whoshowedmethemiracleoflearning.IlyaWagnerToallmystudents,whomakeworkinginthefieldofverificationsucharewardingexperience.ValeriaBertaccoPrefaceThegrowingcomplexityofmodernprocessordesignsandtheirshrinkingproduc-tionschedulescauseanincreasi
6、ngnumberoferrorstoescapeintoreleasedproducts.Manyoftheseescapedbugscanhavedramaticeffectsonthesecurityandstabil-ityofconsumersystems,underminetheimageofthemanufacturingcompanyandcausesubstantialfinancialgrief.Moreover,recenttrendstowardsmulti-corepro-cessorchips,withcomplexmemorysubsystemsan
7、dsometimesnon-deterministiccommunicationdelays,furtherexacerbatetheproblemwithmoresubtle,yetmoredevastating,escapedbugs.Thisworseningsituationcallsforhigh-efficiencyandhigh-coverageverificationmethodologiesforsystemsunderdevelopment,agoalthatisunachievable
