security analysis and fault injection experiment on aesnew

security analysis and fault injection experiment on aesnew

ID:34512326

大小:2.73 MB

页数:7页

时间:2019-03-07

security analysis and fault injection experiment on aesnew_第1页
security analysis and fault injection experiment on aesnew_第2页
security analysis and fault injection experiment on aesnew_第3页
security analysis and fault injection experiment on aesnew_第4页
security analysis and fault injection experiment on aesnew_第5页
资源描述:

《security analysis and fault injection experiment on aesnew》由会员上传分享,免费在线阅读,更多相关内容在教育资源-天天文库

1、SecurityanalysisandfaultinjectionexperimentonAESOlivierFaurax1,2,TraianMuntean21EcoledesMinesdeSt´Etienne-SiteGeorgesCharpak,LaboratoireSESAM,AvenuedesAn´emones,13120GAR-´DANNE,FRANCE2UniversitedelaM´editerran´ee,”Syst´emesInformatiquesCommunicants”,13288MARSEILLE,FRANCE`E-mail:faurax@ems

2、e.frRobustnessofcryptographiccircuitsagainstfaultattacksisagreatconcerntoensuresecurity.Inthispaper,wepresentasecurityanalysisofsuchcircuitsandafaultinjectionmethodologyandtool(PAFI).WeapplythemtoAESasacasestudyandshowthatinjectedfaultsthatleadtoknownfaultattacksmatchouranalysis.Mots-cles

3、:´faultattacks,cryptography,AES1IntroductionCryptographiccircuitsareoftenafoundationofsecurityinnowadayssystems.Asaconsequence,attacksonthemarecriticalandcanbeusedtodefeatsecuritypolicies.Inthiscontext,theprotectionagainstattacksisamajorconcern.Afaultattackusesaphysicalperturba-tionofthec

4、ircuitinordertoobtainfaultycomputations.Thesemiscomputedresultscanenablecryptanal-ysisandrevealsecretdata.Severalcryptosystemsareconcernedbythistypeofattacks:RSA[BDL97],DES[BS97]andAES[Gir04][DLV03][PQ03].Therobustnessagainstfaultattacksmustbeevaluatedtoensurefaulttoleranceandsecurity.Thi

5、scanbeachievedbyinjectingfaultsinthesysteminordertovalidateitsbehaviorunderfaultattacks.Itispossibletodothisusingphysicalfault[GKT89][AAA+90][MRMS94],butthiscanalsobedoneusingbuilt-indebugmechanisms[FSK97][BPRR98].Anotherapproachistousefaultinjectionduringsimulationtoproviderobustnesseval

6、utationbeforesiliconICmanufacturinginanrelativelyunexpensivemanner.Simulatingthecircuitpermitstoinjectfaultbymodifyingitsdescription[JAR+94][LH00][ZME03]ortoaddacustomfaultinjectorinthedesign[FMR06].Ourapproachistouseanunmodifieddescriptionofthecircuittobeveryaccurateregardingtothecorrespo

7、ndingphysicalcircuit.However,somepropertiesofcryptographicalgorithmcanbeusedtopredictthetemporalsensitivityofcircuits.Inthispaper,weproposeametricofsensitivityagainstfaultattacksforcircuitsandvalidateitusingfaultinjectioninsimulationonAES.Thispaperisorganizedasfollo

当前文档最多预览五页,下载文档查看全文

此文档下载收益归作者所有

当前文档最多预览五页,下载文档查看全文
温馨提示:
1. 部分包含数学公式或PPT动画的文件,查看预览时可能会显示错乱或异常,文件下载后无此问题,请放心下载。
2. 本文档由用户上传,版权归属用户,天天文库负责整理代发布。如果您对本文档版权有争议请及时联系客服。
3. 下载前请仔细阅读文档内容,确认文档内容符合您的需求后进行下载,若出现内容与标题不符可向本站投诉处理。
4. 下载文档时可能由于网络波动等原因无法下载或下载错误,付费完成后未能成功下载的用户请联系客服处理。