磁粉探伤系统散焦图像复原暨dsp微裂纹图像识别系统的研究

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1、摘要本文主辫包括两方面内容。自动磁糨探伤系统散焦圈像复原的研究：熬于DSP的微裂纹瓣攘娃理鬈绕疆箨竣诗。自动磁粉探伤系统用计算机视觉观察来代替人眼判断缺陷，提高了零件梭测的效率和可靠憔。但在襄际应用申，系统来豢的图像常出现教焦模糊现象，这绘裂纹识剔增加了干扰，甚黧静蘩诿粥。本文篱先套锈了磁耪探伤、数字瀚像及整像复甄躺糯关知识裙基本豫理；根据自动磁粉搽伤系统威用的要求，给出了一种基予参数辨识Wiener滤波图像复原方法，并进挣姒TLAB实验分攒。挺基一率争基于数焦半弪翡复藏鼓象熬谔刿撼准；采翔VC++6。0编程，实辘,IP氅G解褥并转换成蕊舻文件格式，然后交按

2、为灰发鞠像，再对散焦徽袋纹蔼像进行复原处理。该复原方法的提出及vc十+程序实现解决了自动磁耪探伤在实际应用中的“瓶颈”翅纛。在实现了基于Pc机软件系统的基础上，对蒸于DSP微裂纹图像处理系绒进行了研究。介绍了TI公闭TMS320VC5410的结构和特点，完成了硬件电路的设计和调试，给出了变验数据，著与PC枫较终系绫进行了玩较。基于DSP静疆徉设计解决了PC较释系统存在静速度同题，达到了预期效果。美镰诵：酝糖搽岱，麓像建鬻，教焦鞠像，嚣像菱蘸，DSPAbstract’rhethesisineludesmainlytwo脚s：theresearchofout-o

3、f-focusimagerestorationoftheautomaticmagneticparticletestingsystemandhardwaredesignofmicro-crackimageprocessingsystembasedonDSP．TheautomaticmagneticparticletesfiRgsystemimprovesefficiencyandreliabilityofparttesting,whileitsubstitutescompm町visionforoperator’swatching．Infact,theimage

4、sacquiredamoftenblun'edbvtheout-of-focusing,whichsetstheobstacleformicro-crackidentification．．fartherleadstofalseidcntitication．Inthethesis，theknowledgeandprincipleonmagneticpartictetesting,酬imageandimagerestorationareintroducedfirst．Accordingtodemandofthesystem．theWienerfilterrest

5、orationbased∞parameteridentificationisproposodandanalyzedbytheMatlabexperiment,thespecificationofevahiatingeffectofimagerestorationispresentedaccordingtoout-of-focusradiusaswell．erogr峨byVisualc十佰．0．JPEOimagefilesaredecodedandconvertedintoBh口files,colorfulinlsgeisconvertedintograyim

6、ageandout-of-focusmicro-crackimageisrestored．TherestorationtechniqueandVC++programapplicationresolvethe‘'bottle-neck”problemofthesystem．BasedOiltherealizationofPC’Ssoftwaresystem,hardwaredesignofmicro-crackimageprocessingsystembasedonDSPisstudied．Thestructureandfe刮fI

7、msofTICO．TMS32

8、0VC5410amintrDcluced．hardwaredesignanddebuggingareaccmplishedandexperimemdataaregained，thedistinctionbetweenDSPandPCiscompared．1khardwaredesignoftDSPresolvesthepmblemofthesystemspeedandattainstotheexpectederiect．Keywords：magneticparticletesting，imagep∞cesshl舀DSp第一章绪论1．1磁粉探伤磁粉探伤是五种常

9、规的无损检测方法之一，是磁性材料表面缺陷检测中用得最