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ID:29934653
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时间:2018-12-25
《smt回流焊工艺中英文对照》由会员上传分享,免费在线阅读,更多相关内容在应用文档-天天文库。
1、·SMT回流焊工艺中英文对照·1.FundamentalsofSoldersandSoldering(焊料及焊接基础知识)SolderingTheory(焊接理论)MicrostructureandSoldering(显微结构及焊接)EffectofElementalConstituentsonWetting(焊料成分对润湿的影响)EffectofImpuritiesonSoldering(杂质对焊接的影响)2.SolderPasteTechnology(焊膏工艺)SolderPowder(锡粉)SolderPasteRheolog
2、y(锡膏流变学)SolderPasteComposition&Manufacturing(锡膏成分和制造)3.SMTProblemsOccurredPriortoReflow(回流前SMT问题)FluxSeparation(助焊剂分离)PasteHardening(焊膏硬化)PoorStencilLife(网板寿命问题)PoorPrintThickness(印刷厚度不理想)PoorPasteReleaseFromSqueegee(锡膏脱离刮刀问题)Smear(印锡模糊)Insufficiency(印锡不足)NeedleCloggin
3、g(针孔堵塞)Slump(塌落)LowTack(低粘性)ShortTackTime(粘性时间短)4.SMTProblemsOccurredDuringReflow(回流过程中的SMT问题)ColdJoints(冷焊)Nonwetting(不润湿)Dewetting(反润湿)Leaching(浸析)Intermetallics(金属互化物)Tombstoning(立碑)Skewing(歪斜)Wicking(焊料上吸)Bridging(桥连)Voiding(空洞)Opening(开路)SolderBalling(锡球)SolderBea
4、ding(锡珠)Spattering(飞溅)5.SMTProblemsOccurredatPostReflowStage(回流后问题)WhiteResidue(白色残留物)CharredResidue(炭化残留物)PoorProbingContact(探针测接问题)SurfaceInsulationResistanceorElectrochemicalMigrationFailure(表面绝缘阻抗或电化迁移缺陷)Delamination/Voiding/Non-curingOfConformalCoating/Encapsulant
5、s(分层/空洞/敷形涂覆或包封的固化问题)6.ChallengesatBGAandCSPAssemblyandReworkStage(BGA、CSP组装和翻修的挑战)StarvedSolderJoint(少锡焊点)PoorSelf-Alignment(自对位问题)PoorWetting(润湿不良)Voiding(空洞)Bridging(桥连)UnevenJointHeight(焊点高度不均)Open(开路)PopcornandDelamination(爆米花和分层)SolderWebbing(锡网)SolderBalling(锡球)
6、7.ProblemsOccurredatFlipChipReflowAttachment(倒装晶片回流期间发生的问题)Misalignment(位置不准)PoorWetting(润湿不良)SolderVoiding(空洞)UnderfillVoiding(底部填充空洞)Bridging(桥连)Open(开路)UnderfillCrack(底部填充裂缝)Delamination(分层)FillerSegregation(填充分离)InsufficientUnderfilling(底部填充不充分)8.OptimizingReflowPr
7、ofileviaDefectMechanismsAnalysis(回流曲线优化与缺陷机理分析)FluxReaction(助焊剂反应)PeakTemperature(峰值温度)CoolingStage(冷却阶段)HeatingStage(加热阶段)TimingConsiderations(时间研究)OptimizationofProfile(曲线优化)ComparisonwithConventionalProfiles(与传统曲线的比较)Discussion(讨论)ImplementingLinearRampUpProfile(斜坡式
8、曲线)
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