毕业论文外文翻译-使用8051单片机验证和测试单粒子效应的加固工艺

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1、ValidationandTestingofDesignHardeningforSingleEventEffectsUsingthe8051MicrocontrollerAbstractWiththedearthofdedicatedradiationhardenedfoundries,newandnoveltechniquesarebeingdevelopedforhardeningdesignsusingnon-dedicatedfoundryservices.Inthispaper,wewilldiscusstheimplications

2、ofvalidatingthesemethodsforthesingleeventeffects(SEE)inthespaceenvironment.Topicsincludethetypesofteststhatarerequiredandthedesigncoverage(i.e.,designlibraries:dotheyneedvalidatingforeachapplication?).Finally,an8051microcontrollercorefromNASAInstituteofAdvancedMicroelectroni

3、cs(IAμE)CMOSUltraLowPowerRadiationTolerant(CULPRiT)designisevaluatedforSEEmitigativetechniquesagainsttwocommercial8051devices.IndexTermsSingleEventEffects,Hardened-By-Design,microcontroller,radiationeffects.I.INTRODUCTIONNASAconstantlystrivestoprovidethebestcaptureofsciencew

4、hileoperatinginaspaceradiationenvironmentusingaminimumofresources[1,2].Witharelativelylimitedselectionofradiation-hardenedmicroelectronicdevicesthatareoftentwoormoregenerationsofperformancebehindcommercialstate-ofthe-arttechnologies,NASA’sperformanceofthistaskisquitechalleng

5、ing.Onemethodofalleviatingthisisbytheuseofcommercialfoundryalternativeswithnoorminimallyinvasivedesigntechniquesforhardening.Thisisoftencalledhardened-by-design(HBD).Buildingcustom-typeHBDdevicesusingdesignlibrariesandautomateddesigntoolsmayprovideNASAthesolutionitneedstomee

6、tstringentscienceperformancespecificationsinatimely,cost-effective,andreliablemanner.However,onequestionstillexists:traditionalradiation-hardeneddeviceshavelotand/orwaferradiationqualificationtestsperformed;whattypesoftestsarerequiredforHBDvalidation?II.TESTINGHBDDEVICESCONS

7、IDERATIONSTestmethodologiesintheUnitedStatesexisttoqualifyindividualdevicesthroughstandardsandorganizationssuchasASTM,JEDEC,andMIL-STD-883.Typically,TID(Co-60)andSEE(heavyionand/orproton)arerequiredfordevicevalidation.SowhatisuniquetoHBDdevices?Asopposedtoa“regular”commercia

8、l-off-the-shelf(COTS)deviceorapplicationspecificintegratedcircuit(ASIC)wher