GB-T18907-2002 透射电子显微镜选区电子衍射分析方法

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1、ICS37.02007.180N33中华人民共和国国家标准GB/T18907-2002透射电子显微镜选区电子衍射分析方法Methodofselectedareaelectrondiffractionfortransmissionelectronmicroscopes2002一12一05发布2003一05一01实施中华人民共和匡国家质量监督检验检疫总婿GB/T18907-2002目次前言·····················································，······································

2、··················。··⋯⋯皿1范围···，，······························································，·········································⋯⋯12原理············································································································⋯⋯13仪器设备····························

3、············································································⋯⋯14试样·········，，···································································································⋯⋯15参照样品······················································································

4、···················⋯⋯26试验方法·······································································································⋯⋯26.1仪器准备···································································································⋯⋯26.2选区电子衍射谱的获得·............................··

5、····················································⋯⋯26.3衍射常数La的测定··················，····································································⋯⋯27衍射谱的测量与计算········，·················································································⋯⋯3附录A(规范性附录)纯金与纯铝的晶面间距表··⋯‘·

6、·················································⋯⋯4附录B(规范性附录)单晶体的标准衍射谱·················。······································⋯⋯S-B.1面心立方晶体的低指数晶带衍射谱····································································⋯⋯5B.2体心立方晶体的低指数晶带衍射谱·······，·······，········，·······················

7、···················⋯⋯7B.3密排六方晶体的低指数晶带衍射谱······································································一9参考文献·····························，···················································，··························⋯⋯12GB/'r18907-2002前言本标准的附录A和附录B为规范性附录。本标准由全国微束分析标准化技术委员会提出。