GBT 2423.27-2005电工电子产品环境试验

《GBT 2423.27-2005电工电子产品环境试验》由会员上传分享，免费在线阅读，更多相关内容在行业资料-天天文库。

1、ICS19.040K04绷黔中华人民共和国国家标准GB/T2423.27-2005八EC60068-2-39:1976代替GB/T2423.27-1981电工电子产品环境试验第2部分:试验方法试验Z/AMD低温/低气压/湿热连续综合试验Environmentaltestingforelectricandelectronicproducts-Part2:Testsmethods-TestZ/AMD:Combinedsequentialcold,lowairpressureanddampheattest(IEC60

2、068-2-39:1976,Basicenvironmentaltestingprocedures-Part2:Tests-TestZ/AMD:Combinedsequentialcold，lowairpressureanddampheattest,IDT)2005-08-26发布2006-04-01实施中华人民共和国国家质量监督检验检疫总局发布中国国家标准化管理委员会GB/T2423.27-2005/IEC60068-2-39:1976目次前言目的试验的一般说明，。。。。····，··，···········

3、···············································，，·。。，····，，，············⋯⋯1试验设备的说明····，，。。。。。·。。·，·，，，，，，，················································、·。········，，，·········⋯⋯1试验程序··························，··，·······，····································

4、·········‘·，。·。···，，，，··⋯⋯1预处理·.............................······，，，····..................................................................I初始检测.................................................···············，·，，甲，，，··················，··，，···，一1条件试验·········

5、·································，·。··，，····，，，································。···············⋯⋯2恢复···························，，·······················，···，·······························。········。·。。·····，，，，二2最后检测·····································。····

6、···，，，，·，，················································。，·。·，2相关规范应作出的信息·························，······，····，，，·，·····，，············，······················⋯⋯2GB/T2423.27-2006八EC60068-2-39:1976前言本部分是GB/T2423《电工电子产品环境试验》的一部分。本部分等同采用IEC60068-2-39;1976《基本环境试

7、验规程第2部分:试验方法试验Z/AMD:寒冷、低气压和湿热连续综合试验》(英文版)。本部分技术内容与IEC60068-2-39:1976《基本环境试验规程第2部分，试验方法试验Z/AMD:寒冷、低气压和湿热连续综合试验)(英文版)相同，编写格式与表达方式符合GB/T1.12000和GB/T20000.2-2001的有关规定。为便于使用，本部分对于IEC60068-2-39;1976作了下列编辑性修改:a)为了GB/T2423《电工电子产品环境试验》各部分的名称协调一致，本部分未完全采用IEC60068-2-39

8、;1976的中文译名，而改为《电工电子产品环境试验第2部分:试验方法试验Z/AMD:低温/低气压/湿热连续综合试验》;b)删除了IEC60068-2-39;1976的前言本部分发布实施后代替GB/T2423.27-1981《电工电子产品基本环境试验规程试验Z/AMD:低温/低气压/湿热连续综合试验方法》。本部分与GB/T2423.27-1981相比主要变化如下:a)为了GB/T2423