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ID:50433108
大小:1.03 MB
页数:13页
时间:2020-03-06
《ATPGpaper D算法和PODEM算法的具体实现过程.pdf》由会员上传分享,免费在线阅读,更多相关内容在行业资料-天天文库。
1、A/&TTUTORIALALGORITHMSFORPATTERNGENERATIONTOMKIRKLANDnetaskthatmaybeaperfectcandidateforMicroelectronicsandautomationistestpatterngenerationforcom-binationaldigitalcircuits.Manyengineerscon-ComputerTechnologyCorp.0siderthisworkmoretediousandlessM.RAYMERCERrewardingthanotheraspectsoft
2、hedesignprocess,butUniversityofTexastheyalsorecognizethatitisessentialtothequalityofthefinalproduct.Threewell-knownalgorithmsfortheAlgorithmsforautomatictestgenerationfocusprimar-automaticgenerationoftestpatternsforilyonwaystoproducetestsforcombinationalcircuits.’digitalcircuitsareth
3、eDalgorithm,Testsforthesecircuitsinvolvechoicesfrommanypossi-Podem,andFan.Thistutorialintroducesbilities,soclassicalcomputersearchmethodsareusuallytheconceptoftestgenerationandthebasisforthealgorithm.Thesesearchtechniquesuseanalyzesthewayeachalgorithmusesinformationinthenetworktopolo
4、gytospecifytheinputssearchandbacktrackingtechniquestothatformthetestpattern.Thetechniqueshavebecomesensitizeafaultandpropagateittoanobservablepoint.moreefficientovertimeaswehavelearnedmorewaystousethisinformation.ThreeofthebestknownalgorithmsforcombinationalATPGaretheDalgorithm;*Pode
5、m,shortforpath-orienteddecisionmaking;3andFan.4Allthreealgorithmsoperateonlyoncombinationalcircuits.Ouranalysisfocusesonthesearchandcontrolmechanismsofeachalgorithm.WealsolookattheheuristicsusedtoguideATPGsearchandthenotationusedtorepresentcircuitvalues.Fujiwara5andBottorff‘givealter
6、nativeviewsofthesamealgorithms.June19880740-7475/88/0600~43$100s~198843TPGTUTORIALGEMERATINCATESTSETsurface,butithasbeenquiteusefulinpractice.Thereasonisthatifwecandetectalargeper-Theobviousreasontotestcircuitsistosepa-centageofthesinglestuck-atfaults,wewillrategoodonesfromfaultyones
7、.Considertheusuallygetatestsetthatdetectsacorrespond-digitalcircuitinFigurela,whichisalsorepre-inglyhighpercentageofallfailures.’WecansentedbythegraphinFigurelb.Thegraphnodesrepresentcircuitdevices,orgates,whilealsousestuck-atfaultmodelsthathavebeendevelopedforaparticulartechnologywi
8、thgoodgraphe
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