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1、AFMenhancingtraditionalElectronMicroscopyApplicationsModulusDr.JohannesH.KindtWhatisAFM?•Microscopytechniquebasedonlocalmechanicalcontact•Resolution<1-5nm•sampletopography•surfacemechanicalproperties•Ambient&fluidconditions•Establishedin:MaterialsScience,Semiconductors,Biological&
2、otherAcademicResearch•About18.000toolsWWJohannes.Kindt@Bruker-nano.comComparisonEM/AFMTEMSEMAFMPrincipleEl.Shadowing,El.scattering,sec.Mechanical(Lennard-diffractionelectronsJones,..)Resolution<0.1nm<1nm20pm-5nm.~30pminz.Max.Fieldofview10sofummmTyp.30-200umFieldDepthSamp.Th.100nmu
3、m..mm3-20um(Tip/Piezo)MaterialcontrastDensityElementYoung’smod.,adhesion,deform..EnvironmentsHighVacuumVacuumAmbient,fluids,reagents,gasesSpeed(hiresscan)<1min<1min<1min(FastScan)Sampleprep<100nmthickDry&conductiveforOnahorizontalsurfacehighresolutionAFM-strengths:Highresolutionin
4、air/gas/fluid.Highresolutiononnonconductiveopaquesamples.Zresolution.Materialmechanicalpropertycontrast.Oftenminimalsampleprep.Johannes.Kindt@Bruker-nano.comUnderstandingAFMresolutionLateral:AFMtipContactArea“Hard”Material“Soft”MaterialRtip(e.g.Mineral,Metal)(e.g.Gel,Protein)e.g.R
5、tip=2nmLateralResolution:<<2nmLateralResolution:~2nmSomefactorsthatcanfurtheraffectachievablelateralresolution:•Moisturelayeronthesurface(inair)•Ionicscreeningcharges(influid)•Tipengagerobustness(AFM’sabilitytopreservethetipduringengage)Vertical:VerticalAFMresolutionislimitedbypos
6、itionnoise(withmechanical,electricalandfundamental(thermal)contributions)e.g.DimensionFastScan:<0.3Angstrom(30pm)Johannes.Kindt@Bruker-nano.comFastScanResolutionexample:HardSurfaceMuscoviteMica(a:atomiclayers,b:lattice)ScanSize.Stability.ac5nm1um13Seconds100nm157Seconds20um,20line
7、s/s1024x1024pixels5.3Seconds20nm,6.5Lines/s.2um,48lines/sJohannes.Kindt@Bruker-nano.comFastScanResolutionexample:SoftSurface2DcrystalofBacteriorhodopsintrimericcomplexesr(nm)5.49DataDetails:3.17•DimensionFastScan™•Probe:Broadband–C(special)•Mode:PF-Tappinginfluid•PFT-Frequency:8kH
8、z•PFT-Amplitude:2nm•Linerate:8.8l
