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1、CombinationalProfilesofSequentialBenchmarkCircuitsFrancBrglez*,DavidBryan,KrzysztofKoiminskiMicroelectronicsCenterofNorthCarolinaP.O.Box12889,3021CornwallisRd,ResearchTrianglePark,NC27709Abstractfullscan-basedalgorithmsfortestpatterngenera-tion,butalsotoidentifyopportun
2、itiesandlimitationsThispaperpresentsasetof31digitalsequentialforsequentialtestpatterngenerationalgorithms,circuitsdescribedatthegatelevel.Thesecircuitswithorwithouttheassistanceofpartialscan.MostextendthesizeandcomplexityoftheISCAS'85setofsignificantly,thesebenchmarksex
3、tendtherangeofcombinationalcircuitsandcanserveasbenchmarkscurrentISCAS'85benchmarksbothintheirsizeasforresearchersinterestedinsequentialtestwellascomplexity.Whileallbenchmarknetlistsaregeneration,scan-basedtestgeneration,andmixedbydefaultexpandedforsynchronouscircuitseq
4、uential/scan-basedtestgenerationviapartialscanbehavior,asynchronousbehaviorandadditionaltechniques.Althoughallthebenchmarkcircuitsarefaultscanbeintroducedbyappropriatemodelingofsequential,synchronous,anduseonlyD-typeflip-Dflip-flopprimitivesasdiscussedlaterinthepaper.fl
5、ops,additionalinteriorfaultsandasynchronousFollowingourcallforcontributionsinSeptem-behaviorcanbeintroducedby'substitutingsomeorber1988,thebenchmarkswereassembledfromalloftheflip-flopswiththeirappropriatefunctionalvariousnetlistformatsreceivedfromindustrialandmodels.The
6、standardfunctionalmodelofaDflip-universitysourcesfromtheUSAandabroad.Weflopprovidesareferencepointindependentofthealsosynthesizedseveralofthebenchmarksautomati-faultsparticulartotheflip-flopimplementation.Incally,asapartoftheon-goingresearchatMCNC.thispaper,atestability
7、profileofthebenchmarksinThefirstpartofthepaperpresentsthethefull-scanmodeconfigurationisdiscussed.benchmarks,theiressentialcircuitparameters,andanystructuralcharacteristicsthatwerepassedontoIntroductionus.Atestabilityprofileisdeterminedforthefull-scanmodeconfigurationso
8、fallcircuitsinordertoTheadvancesinautomatictestpatterngenera-establishthebasisforcomparisonsofscan-,partialtio
