SoC设计方法与实现第十章DFT

《SoC设计方法与实现第十章DFT》由会员上传分享，免费在线阅读，更多相关内容在教育资源-天天文库。

1、第十章可测试性设计OutlinesOverviewofICTestingFaultModelingAutomaticTestPatternGeneration(ATPG)Design-for-test(DFT)techniquesScanchaintechniqueMBISTBoundaryScanVerificationvs.TestVerificationVerifiescorrectnessofdesign.Performedbysimulation,hardwareemulation,orformalverification,etc.Performedoncepriorto

2、manufacturing.Responsibleforqualityofdesign.TestVerifiescorrectnessofmanufacturedhardware.Two-partprocess:1.Testgeneration:softwareprocessexecutedonceduringdesign2.Testapplication:electricaltestsappliedtohardwareTestapplicationperformedoneverymanufactureddevice.Responsibleforqualityofdevices.T

3、estingPrincipleThreebasicelementAknowninputStimulusAknownstateAknownexpectedresponseAutomaticTestEquipment(ATE)OverviewofICTestingWaferFabricationDieAssemblyFinalTestReliabilityStressClassProbeDieSortProbeParameterVtPVtNIgSIdSLeffWeffRes...CoverageleakagememoryCore...CoverageDCACDigitalAnalogS

4、peedTempPower...QualificationBurn-inTemp-CycleHVSTESDLatch-up...PackageBGAQFPPGATABCSPSIPMCM...DesignTestChallengesReducethecostoftestReducethevectordatasizeReducethetestersequencingcomplexityReducethecostoftestequipmentReducethetesttimeIncreasethedefectcoverageHowmanyfunctiontestpatternscanco

5、verallthedevices?OutlinesOverviewofICTestingFaultModelingAutomaticTestPatternGeneration(ATPG)Design-for-test(DFT)techniquesTypesofTestVectorSetsExhaustiveApplyeverypossibleinputvectorAlongtime!FunctionalTesteveryfunctionofthedeviceHowtoguaranteethecoverage?FaultModelDerivedFindatestforevery“mo

6、deled”faultIndustrypracticecurrentlyWhyModelFaults?FaultmodelidentifiestargetfaultsFaultmodelmakesanalysispossibleEffectivenessmeasurablebyexperimentsDefect&FaultModelingDefinitionDefect:PhysicalabnormallyfabricateddieE.g.missing/extramaterialFault:behaviordifferenceduetoadefectE.g.inputstuck-

7、at‘1’,outputslow-to-riseError:machinefailureduetoafaultE.g.systemfunctionalfailureBug–functionalfailurecausedbydesignproblemE.g.systemfunctionalfailureDefect:shorttothegrandFault:signalbstuckatlogic0Error:happenswhena=1b=1ExampleFaultMo