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1、CharacterizationofPCBInsertionLosswithaNewCalibrationMethodJiaGongxian,HuaweiTechnologies,Inc.jiagongxian@huawei.comZhuWenxue,HuaweiTechnologies,Inc.zhuwenxue@huawei.comLongFaming,HuaweiTechnologies,Inc.longfaming@huawei.comChengNing,KeysightTechnologies,Inc.ning_cheng@keysight.comMikeResso,
2、KeysightTechnologies,Inc.mike_resso@keysight.comAbstractThereareseveralexistingtechniqueslikeDirectLossSubtraction,Through-Reflection-Line(TRL)calibrationandAutomaticFixtureRemoval(AFR)with2XThroughfixturesforcharacterizingPCBunitlengthinsertionloss.Inthispaper,1)anewmethodforcharacterizingP
3、CBlossbyusingAFRwith1XOpenfixturesisproposed.ThisnewmethodhasbeenprovedtohavethesimilaraccuracywithTRLandAFRwith2Xthroughs,butcansavemuchmorePCBareaandmeasurementtime;2)basedonmeasurementsandsimulationsoftransmissionlineswithdifferentreferenceimpedance,themeasurementbandwidth,accuracy,effici
4、encyandcostofthesetechniquesarecompared.Author(s)BiographyJiaGongxian,PrincipleEngineerinHuawei,Responsibleformodeling,simulationandvalidationofhigh-speedinterconnectchannelsince2001,PCBmaterialElectricalperformancemodeling,PCBprocessingeffectonchannelsignalintegrityanalysis,modelingvalidati
5、onetc.since2006.Heholdsseveralpatentsonhighspeedinterconnect,gotaPHD.degreeinPrecisionInstrumentandMechanicsfromChongqingUniversityin2001.ZhuWenxue,SIEngineerinHuawei,isresponsibleforPCBmaterialElectricalperformancecharacterizationsince2010.HeholdsaM.S.degreeinMeasuringandTestingTechnology&I
6、nstrumentsfromUniversityofElectronicScienceandTechnologyofChina.LongFaming,SIEngineerinHuawei,isresponsibleforPCBmaterialElectricalperformancecharacterization,PCBprocessingeffectonchannelelectricalperformanceanalysisandmethoddevelopmentsince2011,whograduatedfromUniversityofElectronicSciencea
7、ndTechnologyofChinawithmaster‘sdegree.ChengNingisanapplicationengineerworkingwithComponentTestDivisionofKeysightTechnologies.HeusedtoworkonthesoftwaredevelopmentofKeysightPhysicalLayerTestSystem(PLTS)for6yearsandpublishedseveralpapersonfixtureremov
