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1、AcceleratedLifetimeTestforIsolatedComponentsinLinearDriversofHigh-VoltageLEDSystem1,31,31,3,521,3BoSun,SauWeeKohCadmusYuanXuejunFanGuoqiZhang1BeijingResearchCenter,DelftUniversityofTechnology,Haidian,Beijing,100086,China2LamarUniversity,Beaumont,Texas,77710,USA3StateKeyLabo
2、ratoryofSolid-StateLighting,Haidian,Beijing,100086,China4StateKeyLaboratoryofSolid-StateLighting(ChangzhouBase),Wujin,Changzhou,Jiangsu,213161,China5ResearchandDevelopmentCenterforSemiconductorLighting,InstituteofSemiconductors,ChineseAcademyofSciences,Haidian,Beijing,10008
3、6,ChinaAlthoughresearchoncomponentsandsubsystemsofAbstractSSLdriverattractmoreandmoreattentionsinceUSDoEThispaperproposesanisolatedcomponentreleaseditsMulti-YearPlanningProgramforSolidStateacceleratedlifetimetestingofhigh-voltageSSLdriver.InLighting,onlyafewstudieshavetried
4、toinvestigatethethismethod,themostcriticalcomponent(s)willbeimpactofcriticalcomponentdegradationinthewholeisolatedfromtherest,andcriticalstresswillbeappliedtosystembyacceleratingtest[1].Therefore,itisreasonablethesecomponentstoestimatethelifetime.Althoughandnecessarytodevel
5、optheacceleratedlifetestmethodcircuitmodificationisunavoidable,thistestingmethodforisolatedcriticalcomponentfromothersinthetest.canminimizefailureinteractionsbetweencomponentsandtestingdurationforthesystem.Thus,comparedtotheconventionalacceleratedtestingmethod,thismethodcou
6、ldachieveshortertestduration.Intheconfigurationofhigh-voltageLED,theelectrolyticcapacitorshavebeenselectedfromthelineardriverconfiguration.Asoneofmostsignificantfailuremechanisms,theeffectsofhigh(a)LinearDriverStructuretemperaturedegradationofelectrolyticcapacitorstotheenti
7、resystemwereinvestigatedinthistest.Toquantifytheseeffects,thechangesinluminousfluxandpowerconsumptionovertimeweremeasured.Byanalysisofalltheseoutputdata,therelationshipbetweenthesystem’soutputsandtemperatureofelectrolyticcapacitorcanbefound.Forthehigh-voltageLEDsystem,thisr
8、elationship(b)LinearDriverschematicisarequiredconditionfortheaccuratesystemreliabi
