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1、TestReportReportNo.RHS01F009969001Page1of4ApplicantHONGKONGJI-TECHELECTRONICLIMITEDAddress7/FKINONCOMMBLDG49-51JERVOISSTSHEUNGWANHKThefollowingsample(s)andsampleinformationwas/weresubmittedandidentifiedby/onthebehalfoftheclientSampleNameTERMINALPartNo.SLC-*T-P2.0,SLM-*T-P1.3E,SPHD-*T-P
2、0.5,SACH-00*-P0.2,SVF-01T-2.36N/LN,SCN-*T-P1.0,SZN-*T-P0.7K,SWPR-001T-P025,SYM-*T-P0.5A,SZM-*T-P0.7,SVU-21T-P0.6,SYF-*T-P0.5A,SZH-*T-P0.5,SYM-001T-P0.6,SXH-*T-P0.6(N),SZF-*T-P0.7,SSHL-003GA1-P0.2,SXA-*T_P0.6(L),SXF-*T-P0.7,SSH-003T-P0.2(H),SPH-*T-P0.5L/S,SVT-*T-P1.1,SSH-003GA-P0.2,SHF-
3、*T-0.8BS,SVH-*T-P1.1,SPAL-001T-P0.5,SEH-*T-P0.6(L),SVF-*T-P2.0,SPA-001T-P0.5,SBHS(M)-*T-P0.5(A),SSM-*T-P1.4,SVA-41T-P1.1,SBH(M)-001T-P0.5,SSHL-*T-P0.2,SDY-01T-P1.6ASV,RA-SC1290,SSF-*T-P1.4,SDN-21T-P1.5,CN-SAS-1290,SPXA-*-P0.8,SAGH-002GU-P0.3,SHR-*T-P0.6,SPND-*T-P0.5,SBHT-002T-P0.5,SLF-
4、*T-P1.3E,RE-L04,RF-SC*SampleReceivedDateAug.3,2013TestingPeriodAug.3,2013toAug.7,2013TestRequestedAsspecifiedbyclient,totestLead(Pb),Cadmium(Cd),Mercury(Hg),HexavalentChromium(Cr(VI))inthesubmittedsampleanditwastestedasmixture.TestMethodMeasuredTestItem(s)TestMethodEquipment(s)Lead(Pb)
5、IEC62321:2008Ed.1Sec.9ICP-OESCadmium(Cd)IEC62321:2008Ed.1Sec.9ICP-OESMercury(Hg)IEC62321:2008Ed.1Sec.7ICP-OESHexavalentChromium(Cr(VI))IEC62321:2008Ed.1AnnexBUV-VisTestResult(s)Pleaserefertothefollowingpage(s).TestedbyReviewedbyAug.7,2013ApprovedbyDateDannyLiuNo.1078470111TechnicalMana
6、gerCentreTestingInternational(Shenzhen)Co.,Ltd.HongweiIndustrialZone,Bao’an70District,Shenzhen,Guangdong,ChinaTestReportReportNo.RHS01F009969001Page2of4TestResult(s)TestedItem(s)ResultMDLLead(Pb)20mg/kg2mg/kgCadmium(Cd)N.D.2mg/kgMercury(Hg)N.D.2mg/kgHexavalentChromium(Cr(VI))Negative/T
7、estedSample/PartDescriptionMixedtest,metalwithsilveryplatingNote:-Thesample(s)hadbeendissolvedtotallytestedforLead,Cadmium,Mercury.-Asspecifiedbyclient,thetestwasconductedbymixingseveralsamplestogether.Theresult(s)shownonthisreportmaybedifferentfromthecontentofanyhomogeneousmaterial.