Semiconductor Test Product Portfolio.pdf

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1、PrecisionTestSolutionsToMaximizeYieldandReduceCatastrophicRiskInTodayÕsSmallerGeometryICsKeyTekESD&Latch-UpTestSystemsAnalyzeTM¥Detect¥Measure¥ControlWhenElectronicDeviceFailureMinimizeuncertainty.ESDandIsNotAnOptionLatch-Uptestingcanbeanarduousprocess.DefiningqualitystandardsIncreasedinte

2、grationoffunctionalityandtestmethodologiesforyouronsingle,smallergeometrydevicesdevices.Determiningtherightsignificantlyincreasestherealriskofsystemstomeetyourparameters—devicefailureduetoESD(Electrostaticbothnowandinthefuture.RapidDischarge).Andit’safact:ESDacquisitionofthecorrecttestsyst

3、emshazardsarealeadingcauseofdevicetoachieveyourobjectives.Maximizingfailureinthefieldtoday.Thisriskyieldcriticaltoyoursuccess.factorhaswidespreadandpotentiallycatastrophicimplications:itcanimpactThermohasyoursolution.bothproduct"timetomarket"cycles,aswellasend-productreliability.IfnotItbeg

4、inswithpeopleoftechnologyaddressed,theseissuescouldresultworkingwithpeopleoftechnology.inseverefinancialconsequences.Specialistsunderstandingthechallengesyouface.TalkingtheExperiencethemanybenefitsofsamelanguage.RollingupourKeyTekESD&Latch-UpTestSystemsworkingtogetherwithrecognizedsleevesw

5、ithyoutosolvetheproblemexpertsinthefieldofESD&Latch-Upathand.Questioningeverything.testing.OurcommitmenttotheAndanticipatingtheconsequencesofdiscipline—andtothesemiconductoreveryactionwetake.Withfervorandindustry—iswideranging;weactivelycommitment.leadandparticipateonglobalstandardscommitt

6、eesandhaveSoifyou’reasemiconductorqualityhelpeddefinetestmethodologiestoprofessional,testengineerordeviceachieveregulatorystandardsanddesigner,letushelpyouachieveyourproductqualityobjectives.goalswithasolutiontailoredtoyourspecifictestrequirements.BecauseOurgoalistosupportyouwithbydoingso,

7、you’llgainbettercontrollifelongservice—fromapplicationsofyourICdesignandmanufacturingsupport,calibrationservices,andprocess.Youspeedtime-to-marketpreventativemaintenancetofullcycles.Andyoutakeaproactivetechnicalfieldsupport.approachtoreducingtheuncertaintyofse