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1、ACorrelationMatrixMethodofClockPartitioningforSequentialCircuitTestabilityYongChangKimVishwaniD.AgrawalKewalK.SalujaDept.ofElec.andComp.Eng.BellLabsDept.ofElec.andComp.Eng.UniversityofWisconsin-MadisonLucentTechnologiesUniversityofWisconsin-Madison14
2、15EngineeringDr.700MountainAve.1415EngineeringDr.Madison,WI53706MurrayHill,NJ07974Madison,WI53706kimy@ece.wisc.eduva@research.bell-labs.comsaluja@engr.wisc.eduAbstractarecontrolledbyindependentclocksduringthetest.CycleandloopbreakingwasusedasFFpartit
3、ion-Weproposeamethodofpartitioningthesetofallingmethod.Theyshowedthat,ingeneral,twoclocks
ip-
opsinacircuitformultipleclocktesting.Inthewerenotsucientforbreakingallfeedbacks.Einspahrmultipleclocktesting,
ip-
opsarepartitionedintoetal.[4,5]extendedth
4、eideafurthertothemultipledi erentgroupsandeachgroupof
ip-
opshasangroupsandFFsinalooparepartitionedintotwoorindependentclockcontrol.Inourmethod,weuseamoregroups.Similarly,BaegandRogers[2]proposedtestgeneratorassuminganindependentclockcontrolpartition
5、ingofFFstodi erentgroups,eachwithitsforeach
ip-
op.Wethandeterminecorrelationbe-ownclockcontrol,butallFFswithinalooparekeptintweenclockactivityforallpairsof
ip-
ops.Thisin-thesamegroup.Testgenerationissomewhatsimpli-formationisthanusedtoanoptimalorne
6、aroptimal edbutifthecircuithasmanyself-loops,thenumberpartitionof
ip-
opsin.Throughexperiments,weofpartitionsincreases.AlsothepartitioningofFFsisdemonstratethatourpartitioningmethodincreasesdicult,ifnotimpossible,whenthereisaloopcover-faultcoveragea
7、ndreducestestlengthwithalmostnoingallFFsinthecircuit.Rajanetal.[8]introducedahardwareoverheadorperformancepenalty.methodofconvertinghardtoreachstatestoeasiertoreachstatesusingaclocktransformation,whichuses1Introductionlineprobabilitiestodetermineifce
8、rtainstates(FFstobeexact)arehardtoreach.Next,ifitisdeterminedAscomplexityofVLSIcircuitsisgrowing,testgen-thathardtoreachstatesarereallyneededfortesterationforsequentialcircuitsisbecomingincreasinglygeneration,thenthecorrespondingFFsareplacedindicult
