Prognostics and Health Management of Electronics by Utilizing Environmental and Usage Loads.pdf

Prognostics and Health Management of Electronics by Utilizing Environmental and Usage Loads.pdf

ID:33751429

大小:3.90 MB

页数:165页

时间:2019-02-28

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1、ABSTRACTTitleofDocument:PROGNOSTICSANDHEALTHMANAGEMENTOFELECTRONICSBYUTILIZINGENVIRONMENTALANDUSAGELOADSNikhilM.Vichare,DoctorofPhilosophy(Ph.D.),2006DirectedBy:ChairProfessorandDirector,MichaelG.Pecht,DepartmentofMechanicalEngineeringPrognosticsandhealthmanagement(PHM)isamethodthatpermi

2、tsthereliabilityofasystemtobeevaluatedinitsactualapplicationconditions.Thusbydeterminingtheadventoffailure,procedurescanbedevelopedtomitigate,manageandmaintainthesystem.Since,electronicsystemscontrolmostsystemstodayandtheirreliabilityisusuallycriticalforsystemreliability,PHMtechniquesare

3、neededforelectronics.Toenableprognostics,amethodologywasdevelopedtoextractload-parametersrequiredfordamageassessmentfromirregulartime-loaddata.Asapartofthemethodologyanalgorithmthatextractscyclicrangeandmeans,ramp-rates,dwell-times,dwell-loadsandcorrelationbetweenloadparameterswasdevelop

4、ed.Thealgorithmenablessignificantreductionofthetime-loaddatawithoutcompromisingfeaturesthatareessentialfordamageestimation.Theload-parametersarestoredinbinswitha-prioricalculated(optimal)bin-width.ThebinneddataisthenusedwithGaussiankernelfunctionfordensityestimationoftheload-parameterfor

5、useindamageassessmentandprognostics.Themethodwasshowntoaccuratelyextractthedesiredload-parametersandenablecondensedstorageofloadhistories,thusimprovingresourceefficiencyofthesensornodes.Anapproachwasdevelopedtoassesstheimpactofuncertaintiesinmeasurement,model-input,anddamage-modelsonprog

6、nostics.Theapproachutilizessensitivityanalysistoidentifythedominantinputvariablesthatinfluencethemodel-output,andusesthedistributionofmeasuredload-parametersandinputvariablesinaMonte-Carlosimulationtoprovideadistributionofaccumulateddamage.Usingregressionanalysisoftheaccumulateddamagedis

7、tributions,theremaininglifeisthenpredictedwithconfidenceintervals.Theproposedmethodwasdemonstratedusinganexperimentalsetupforpredictinginterconnectfailuresonelectronicboardsubjectedtofieldconditions.Afailureprecursorbasedapproachwasdevelopedforremaininglifeprognosticsbyan

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