fpga芯片互连线测试

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1、代号10701学号1078490726分类TN4密级公开号题（中、英文）目FPGA芯片互连线测试TheInterconnectTestforFPGAChip作者姓名吴九欢指导教师姓名、职务吕红亮教授学科门类工学学科、专业软件工程提交论文日期二〇一三年一月AbstractAbstractThedevelopmentofintegratedcircuittechnologymakethefield-programmablegatearray(FPGA)havelargerscale、strongerfunctionsandricherinternalresour

2、cesaswellasgreatertestingdifficulty.Onthechip,programmableinterconnectresourcewhichbeartheinterconnectionandthesignaltransmissionbetweenlogicblocksisthemostcomplicatedandlargestmodule.Itaccountsfortheproportionoftheresourcesofthewholechipevenmorethan70%.Theprogrammableinterconnectr

3、esource’shighflexibilityandlargescalemakeitstestingmethodhasalwaysbeentheemphasisanddifficultyintheFPGAtestingmethodstudyfield.Thestudyobjectofthispaperistheinterconnecttest.Firstlythispaperdescribedthestructure’sfeatureoftheinternalinterconnectresourcesindetailaswellastheinterconn

4、ection’srelationship.Thedescriptionwhichprovidessupportforthefollow-upstudyfocusonthesingleline,hexlineandlongline’sconnectionandswitchmatrix’scircuitstructure.Andaccordingtothecircuitstructure，asetoffaultmodelhavebeenputforward.Thefaultmodelhascoveredseveralcommonfailuretypesbasic

5、allywhichoftenappearedintheactualcircuitandalsohasbeenoptimizedatthesametime.Thenaseriesoftestingpathshavebeendesignedafterconsideringthefaultmodelandinterconnectionlaw.Inadditiontomeetingthedemandofresourcecoverageandfaultcoverage,thisseriesoftestingpathisalsoverypracticalandeasyt

6、oimplementatthesametime.Finally，twokindoftestingplanhavebeendesignedforthepurposeofproductiontestaswellasdiagnostictestandtheinterconnecttesthavebeencompletedactually.Theexperimentalresultsshowthatthistestingschemenotonlycanobtainhigherresourcescoverageandfaultcoverage,butalsohassi

7、mpleandpracticalfeatures.So,thisinterconnecttestinghasachievedtheexpectedresult.Keywords：FPGAFaultModelTestingPathInterconnectTest目录目录摘要...................................................................................................................................5Abstract......

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