SJT11211-1999-石英晶体元件参数的测量第5部分采用自动网络分析技术.pdf

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1、SJ中华人民共和国电子行业标准SJ/T11211一1999idtIEC444一5:1995石英晶体元件参数的测量第5部分:采用自动网络分析技术和误差校正确定等效电参数的方法MeasurementofquartzcrystalunitparametersPart5:Methodforthedeterminationofequivalentelectricalparametersusingautomaticnetworkanalyzertechniquesanderrorcorrection1999一08一26发布1999一12一01实施中华人民共和国信息产业标准分享网

2、www.bzfxw.com免费下载部发布目次前言IEC前言1范围································································································⋯⋯(1)2引言·.....................................................................................................(I)2.1概述········································

3、·····················································⋯⋯(1)2.2导纳测量法····················································································⋯⋯(2)2.3导纳分析和等效电路参数的估算·························································⋯⋯(4)2.4引用标准·············································

4、····································。·····⋯⋯(4)3测量程序··························································································⋯⋯(4)3.1概述·····························································································⋯⋯(4)3.2环境控制·····························

5、·······················································⋯⋯(4)3.3校准·..........................................................................·················⋯⋯(4)3.4激励电平························································································一(5)3.5Co测量··················

6、········································································⋯⋯(5)3.6测量频率的选择··············································································⋯⋯(5)3.7数据采集·······················································..······························⋯⋯(5)3.8数据修正··········

7、············································································⋯⋯(6)3.9导纳计算········································································，··············⋯⋯(6)3.10导纳分析和等效电路参数的计算························································⋯⋯(6)4导纳测量法的选择················