IEC 62860-2013 （IEEE Std 1620） Test Methods for the Characterization of Organic Transistors and Materials

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1、IEC62860Edition1.02013-08INTERNATIONALIEEEStd1620™STANDARDTestmethodsforthecharacterizationoforganictransistorsandmaterials2008-IEEEStd.1620:2013(E)IEC62860THISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright©2008IEEEAllrightsreserved.IEEEisaregisteredtrademarkintheU.S.Patent&TrademarkOffice,owne

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