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1、ValidationandTestingofDesignHardeningforSingleEventEffectsUsingthe8051MicrocontrollerAbstractWiththedearthofdedicatedradiationhardenedfoundries,newandnoveltechniquesarebeingdevelopedforhardeningdesignsusingnon-dedicatedfoundryservices.Inthispaper,wewilldiscusstheimplicationsofvalidatingthesemeth

2、odsforthesingleeventeffects(SEE)inthespaceenvironment.Topicsincludethetypesofteststhatarerequiredandthedesigncoverage(i.e.,designlibraries:dotheyneedvalidatingforeachapplication?).Finally,an8051microcontrollercorefromNASAInstituteofAdvancedMicroelectronics(IAμE)CMOSUltraLowPowerRadiationTolerant

3、(CULPRiT)designisevaluatedforSEEmitigativetechniquesagainsttwocommercial8051devices.IndexTermsSingleEventEffects,Hardened-By-Design,microcontroller,radiationeffects.I.INTRODUCTIONNASAconstantlystrivestoprovidethebestcaptureofsciencewhileoperatinginaspaceradiationenvironmentusingaminimumofresourc

4、es[1,2].Witharelativelylimitedselectionofradiation-hardenedmicroelectronicdevicesthatareoftentwoormoregenerationsofperformancebehindcommercialstate-ofthe-arttechnologies,NASA’sperformanceofthistaskisquitechallenging.Onemethodofalleviatingthisisbytheuseofcommercialfoundryalternativeswithnoorminim

5、allyinvasivedesigntechniquesforhardening.Thisisoftencalledhardened-by-design(HBD).Buildingcustom-typeHBDdevicesusingdesignlibrariesandautomateddesigntoolsmayprovideNASAthesolutionitneedstomeetstringentscienceperformancespecificationsinatimely,cost-effective,andreliablemanner.However,onequestions

6、tillexists:traditionalradiation-hardeneddeviceshavelotand/orwaferradiationqualificationtestsperformed;whattypesoftestsarerequiredforHBDvalidation?II.TESTINGHBDDEVICESCONSIDERATIONSTestmethodologiesintheUnitedStatesexisttoqualifyindividualdevicesthroughstandardsandorganizationssuchasASTM,JEDEC,an

7、dMIL-STD-883.Typically,TID(Co-60)andSEE(heavyionand/orproton)arerequiredfordevicevalidation.SowhatisuniquetoHBDdevices?Asopposedtoa“regular”commercial-off-the-shelf(COTS)deviceorapplicationspecificintegratedcircuit(ASIC)wher