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时间:2020-05-01
《Offner型成像光谱仪波长使用范围和光谱分辨率研究.pdf》由会员上传分享,免费在线阅读,更多相关内容在行业资料-天天文库。
1、第43卷第7期光子学报Vo1.43No.72014年7月ACTAPHOT0NICASINICAJuly2014doi:10.3788/gzxb2O1443O7.0730004Offner型成像光谱仪波长使用范围和光谱分辨率研究裴梓任,黄元申,张大伟,韩姗,洪瑞金,倪争技(上海理工大学光电信息与计算机工程学院,教育部光学仪器与系统工程中心;上海市现代光学系统重点实验室,上海200093)摘要:研究了Offner型成像光谱仪消像差结构的参量和性能.用几何法推导出Ofiner型成像光谱仪的波长使用范围
2、、系统线色散以及光谱分辨率的计算公式;在理想像差条件下,分析了Offner型成像光谱仪光谱分辨率与入射狭缝的宽度、凸面光栅分辨率和探测器像元尺寸各个因素之间的关系;探讨了提高光谱分辨率采用的方法和技术,解决了光谱仪的各个参量和光谱分辨率之间的矛盾.研究表明:当系统像差很小可忽略时,通过减小狭缝宽度,有利于提高光谱分辨率;Offner型成像光谱仪的分辨率由入射狭缝宽度、光栅和CCD像元尺寸三者中分辨本领最低的参量确定.关键词:光栅光谱仪;波长范围;光谱分辨率;凸面光栅;Offner结构中图分类号:
3、TH744.1文献标识码:A文章编号:1004—4213(2014)07—0730004—6ResearchofWavelengthRangeandSpectralReso1utionforOffner.ImagingSpectrometerPEIZi-ren,HUANGYuan-shen,ZHANGDa-wei,HANShan,HONGRui-jin,NIZheng-ji(UniversityofShanghaiforScienceandTechnology,SchoolofOptical—E
4、lectricalandComputerEngineering,OpticalInstrumentandSystemsEngineeringCenteroftheMinistryofEducation;ShanghaiKeyLaboratoryofModernOpticalSystem,Shanghai200093)Abstract:TheparametersandpropertyofOffnerimagingspectrometerwerestudiedaccordingtoeliminati
5、ngaberrationstructure.Thecalculatingequationsofmeasurablerangeofwavelength,lineardispersionandspectralresolutionwerededucedbygeometrymethodbasedoneliminatingaberrationstructureofOffnerimagingspectrometer~therelationshipofresolutionandeachfactorwerean
6、alyzed,thesefactorsincludingwidthofentranceslit,convexgratingresolutionandpixelsizeofdetector.Whenthesystemaberrationwastobeignored,thespectralresolutioncouldbeenhancedbydecreasingwidthofentranceslit,thisconclusionwasverifiedbyimagingexperiment.Thete
7、chniquesandmethodsofimprovingspectralresolutionweresummarized,thetradeoffbalancebetweeneachparameterandspectralresolutionwereconsidered.Thefina1conclusionwasasfollow:theresolutionofOffnerimagingspectrometerwasdeterminedbythelowestresolutionoftheentra
8、nceslit。convexgratingandpixelsizeofCCD.Keywords:Gratingspectrometer;Wavelengthrange;Spectralresolution;Convexgrating;OffnerconfigurationoCISCodes:300.6190;120.4825;080.2740;050.1950;110.4234基金项目:科技部重大科学仪器专项(Nos.2011YQ15004002,2011YQ15004004,2011YQ140
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