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1、PhysicalPrinciplesofElectronMicroscopyRayF.EgertonPhysicalPrinciplesofElectronMicroscopyAnIntroductiontoTEM,SEM,andAEMWith122FiguresRayF.EgertonDepartmentofPhysics,UniversityofAlberta412AvadhBhatiaPhysicsLaboratoryEdmonton,Alberta,CanadaT6G2R3LibraryofCongressControlNumber:200592471
2、7ISBN-10:0-387-25800-0Printedonacid-freepaper.ISBN-13:978-0387-25800-0©2005SpringerScience+BusinessMedia,Inc.Allrightsreserved.Thisworkmaynotbetranslatedorcopiedinwholeorinpartwithoutthewrittenpermissionofthepublisher(SpringerScience+BusinessMedia,Inc.,233SpringSt.,NewYork,NY10013,U
3、SA),exceptforbriefexcerptsinconnectionwithreviewsorscholarlyanalysis.Useinconnec-tionwithanyformofinformationstorageandretrieval,electronicadaptation,computersoftware,orbysimilarordissimilarmethodologynowknownorhereafterdevelopedisforbidden.Theuseinthispublicationoftradenames,tradem
4、arks,servicemarks,andsimilarterms,eveniftheyarenotidentifiedassuch,isnottobetakenasanexpressionofopinionastowhetherornottheyaresubjecttoproprietaryrights.PrintedintheUnitedStatesofAmerica.(EB)987654321springeronline.comToMaiaContentsPrefacexi1.AnIntroductiontoMicroscopy11.1Limitatio
5、nsoftheHumanEye21.2TheLight-OpticalMicroscope51.3TheX-rayMicroscope91.4TheTransmissionElectronMicroscope111.5TheScanningElectronMicroscope171.6ScanningTransmissionElectronMicroscope191.7AnalyticalElectronMicroscopy211.8Scanning-ProbeMicroscopes212.ElectronOptics272.1PropertiesofanId
6、ealImage272.2ImaginginLightOptics302.3ImagingwithElectrons342.4FocusingPropertiesofaThinMagneticLens412.5ComparisonofMagneticandElectrostaticLenses432.6DefectsofElectronLenses443.TheTransmissionElectronMicroscope573.1TheElectronGun583.2ElectronAcceleration67viiiContents3.3Condenser-
7、LensSystem703.4TheSpecimenStage753.5TEMImagingSystem783.6VacuumSystem884.TEMSpecimensandImages934.1KinematicsofScatteringbyanAtomicNucleus944.2Electron-ElectronScattering964.3TheDynamicsofScattering974.4ScatteringContrastfromAmorphousSpecimens1014.5DiffractionContrastfromPolycrystal
8、lineSpecimens1064.6
